Lowering the synthesis temperature of Ni2P/SiO2 by palladium addition

The addition of small amounts of palladium (0.1%, 0.5% and 1.0% w/w) to a NixPyOz/SiO2 sample led to a decrease of ∼200 K in the synthesis temperature of Ni2P/SiO2, allowing synthesis to proceed at 723 K. In situ X-ray diffraction...

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Detalles Bibliográficos
Autores principales:	Teixeira Da Silva, V., Sousa, L. A., Amorim, R. M., Andrini, Leandro Rubén, Figueroa, S. J. A., Requejo, Félix Gregorio, Vicentini, Flavio C.
Formato:	Articulo
Lenguaje:	Inglés
Publicado:	2011
Materias:	Ciencias Exactas Física Química Nickel phosphide Thiophene hydrodesulfurization X-ray near-edge structure Níquel Rayos X
Acceso en línea:	http://sedici.unlp.edu.ar/handle/10915/84267
Aporte de:	SEDICI (UNLP) de Universidad Nacional de La Plata

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record_format	dspace
institution	Universidad Nacional de La Plata
institution_str	I-19
repository_str	R-120
collection	SEDICI (UNLP)
language	Inglés
topic	Ciencias Exactas Física Química Nickel phosphide Thiophene hydrodesulfurization X-ray near-edge structure Níquel Rayos X
spellingShingle	Ciencias Exactas Física Química Nickel phosphide Thiophene hydrodesulfurization X-ray near-edge structure Níquel Rayos X Teixeira Da Silva, V. Sousa, L. A. Amorim, R. M. Andrini, Leandro Rubén Figueroa, S. J. A. Requejo, Félix Gregorio Vicentini, Flavio C. Lowering the synthesis temperature of Ni<sub>2</sub>P/SiO<sub>2</sub> by palladium addition
topic_facet	Ciencias Exactas Física Química Nickel phosphide Thiophene hydrodesulfurization X-ray near-edge structure Níquel Rayos X
description	The addition of small amounts of palladium (0.1%, 0.5% and 1.0% w/w) to a NixPyOz/SiO<sub>2</sub> sample led to a decrease of ∼200 K in the synthesis temperature of Ni<sub>2</sub>P/SiO<sub>2</sub>, allowing synthesis to proceed at 723 K. In situ X-ray diffraction (XRD) and X-ray absorption near-edge structure (XANES) experiments demonstrated that the phosphate → phosphide transformation started at approximately 673 K, and the total time to reduce the phosphate phase was decreased by the presence of palladium. Based on the in situ P K-edge XANES experiments and CO chemisorption uptakes, it was proposed that, depending on the amount of palladium incorporated, the final catalysts present different degrees of reduction, thereby impacting catalytic activity. An increase in activity was observed for the palladium-containing samples during time on stream, which might be associated with the formation of a phosphosulfide active species. The extent of the phosphosulfide species formation was dependent on the degree of reduction.
format	Articulo Articulo
author	Teixeira Da Silva, V. Sousa, L. A. Amorim, R. M. Andrini, Leandro Rubén Figueroa, S. J. A. Requejo, Félix Gregorio Vicentini, Flavio C.
author_facet	Teixeira Da Silva, V. Sousa, L. A. Amorim, R. M. Andrini, Leandro Rubén Figueroa, S. J. A. Requejo, Félix Gregorio Vicentini, Flavio C.
author_sort	Teixeira Da Silva, V.
title	Lowering the synthesis temperature of Ni<sub>2</sub>P/SiO<sub>2</sub> by palladium addition
title_short	Lowering the synthesis temperature of Ni<sub>2</sub>P/SiO<sub>2</sub> by palladium addition
title_full	Lowering the synthesis temperature of Ni<sub>2</sub>P/SiO<sub>2</sub> by palladium addition
title_fullStr	Lowering the synthesis temperature of Ni<sub>2</sub>P/SiO<sub>2</sub> by palladium addition
title_full_unstemmed	Lowering the synthesis temperature of Ni<sub>2</sub>P/SiO<sub>2</sub> by palladium addition
title_sort	lowering the synthesis temperature of ni<sub>2</sub>p/sio<sub>2</sub> by palladium addition
publishDate	2011
url	http://sedici.unlp.edu.ar/handle/10915/84267
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Lowering the synthesis temperature of Ni<sub>2</sub>P/SiO<sub>2</sub> by palladium addition

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