Study of silane layers grown on steel and characterized using ellipsometry at different wavelengths and incidence angles
Films of gmercap to propyltri methoxysilane are prepared by hydrolysis, condensation and curing at 80 oC. The optical indices, n, k and the thickness d are calculated using the ellipsometry technique.Aprogramme is developed to fit a wide set of ellipsometric and data in the visible optical region...
Guardado en:
| Autores principales: | Seré, Pablo Ricardo, Zerbino, Jorge Omar, Maltz, Alberto Leonardo, Elsner, Cecilia Inés, Di Sarli, Alejandro Ramón |
|---|---|
| Formato: | Articulo |
| Lenguaje: | Inglés |
| Publicado: |
2016
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| Materias: | |
| Acceso en línea: | http://sedici.unlp.edu.ar/handle/10915/81500 |
| Aporte de: |
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