Study of silane layers grown on steel and characterized using ellipsometry at different wavelengths and incidence angles

Films of gmercap to propyltri methoxysilane are prepared by hydrolysis, condensation and curing at 80 oC. The optical indices, n, k and the thickness d are calculated using the ellipsometry technique.Aprogramme is developed to fit a wide set of ellipsometric and data in the visible optical region...

Descripción completa

Guardado en:
Detalles Bibliográficos
Autores principales: Seré, Pablo Ricardo, Zerbino, Jorge Omar, Maltz, Alberto Leonardo, Elsner, Cecilia Inés, Di Sarli, Alejandro Ramón
Formato: Articulo
Lenguaje:Inglés
Publicado: 2016
Materias:
Ingeniería Química
Mercaptopropyltrimethoxysilane
Ellipsometry
Anticorrosive coating
Optical constants
Acceso en línea:http://sedici.unlp.edu.ar/handle/10915/81500
Aporte de:
SEDICI (UNLP) de Universidad Nacional de La Plata
id I19-R120-10915-81500
record_format dspace
institution Universidad Nacional de La Plata
institution_str I-19
repository_str R-120
collection SEDICI (UNLP)
language Inglés
topic Ingeniería Química
Mercaptopropyltrimethoxysilane
Ellipsometry
Anticorrosive coating
Optical constants
spellingShingle Ingeniería Química
Mercaptopropyltrimethoxysilane
Ellipsometry
Anticorrosive coating
Optical constants
Seré, Pablo Ricardo
Zerbino, Jorge Omar
Maltz, Alberto Leonardo
Elsner, Cecilia Inés
Di Sarli, Alejandro Ramón
Study of silane layers grown on steel and characterized using ellipsometry at different wavelengths and incidence angles
topic_facet Ingeniería Química
Mercaptopropyltrimethoxysilane
Ellipsometry
Anticorrosive coating
Optical constants
description Films of gmercap to propyltri methoxysilane are prepared by hydrolysis, condensation and curing at 80 oC. The optical indices, n, k and the thickness d are calculated using the ellipsometry technique.Aprogramme is developed to fit a wide set of ellipsometric and data in the visible optical region 400 nm < ë < 600 nm. An increase in the optical absorption k is detected for the lower concentration ofMPTMS attributed to light absorption from the pores.
format Articulo
Articulo
author Seré, Pablo Ricardo
Zerbino, Jorge Omar
Maltz, Alberto Leonardo
Elsner, Cecilia Inés
Di Sarli, Alejandro Ramón
author_facet Seré, Pablo Ricardo
Zerbino, Jorge Omar
Maltz, Alberto Leonardo
Elsner, Cecilia Inés
Di Sarli, Alejandro Ramón
author_sort Seré, Pablo Ricardo
title Study of silane layers grown on steel and characterized using ellipsometry at different wavelengths and incidence angles
title_short Study of silane layers grown on steel and characterized using ellipsometry at different wavelengths and incidence angles
title_full Study of silane layers grown on steel and characterized using ellipsometry at different wavelengths and incidence angles
title_fullStr Study of silane layers grown on steel and characterized using ellipsometry at different wavelengths and incidence angles
title_full_unstemmed Study of silane layers grown on steel and characterized using ellipsometry at different wavelengths and incidence angles
title_sort study of silane layers grown on steel and characterized using ellipsometry at different wavelengths and incidence angles
publishDate 2016
url http://sedici.unlp.edu.ar/handle/10915/81500
work_keys_str_mv AT serepabloricardo studyofsilanelayersgrownonsteelandcharacterizedusingellipsometryatdifferentwavelengthsandincidenceangles
AT zerbinojorgeomar studyofsilanelayersgrownonsteelandcharacterizedusingellipsometryatdifferentwavelengthsandincidenceangles
AT maltzalbertoleonardo studyofsilanelayersgrownonsteelandcharacterizedusingellipsometryatdifferentwavelengthsandincidenceangles
AT elsnerceciliaines studyofsilanelayersgrownonsteelandcharacterizedusingellipsometryatdifferentwavelengthsandincidenceangles
AT disarlialejandroramon studyofsilanelayersgrownonsteelandcharacterizedusingellipsometryatdifferentwavelengthsandincidenceangles
bdutipo_str Repositorios
_version_ 1764820488155037697

Ejemplares similares