Morphological stabilization and KPZ scaling by electrochemically induced co-deposition of nanostructured NiW alloy films

We have assessed the stabilizing role that induced co-deposition has in the growth of nanostructured NiW alloy films by electrodeposition on polished steel substrates, under pulsed galvanostatic conditions. We have compared the kinetic roughening properties of NiW films with those of Ni films deposi...

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Detalles Bibliográficos
Autores principales: Orrillo, P. A., Santalla, S. N., Cuerno, R., Vázquez, L., Ribotta, S. B., Gassa, Liliana Mabel, Mompean, F. J., Salvarezza, Roberto Carlos, Vela, María Elena
Formato: Articulo
Lenguaje:Inglés
Publicado: 2017
Materias:
Química
Física
electrochemistry
statistical physics
Acceso en línea:http://sedici.unlp.edu.ar/handle/10915/78393
Aporte de:
SEDICI (UNLP) de Universidad Nacional de La Plata
id I19-R120-10915-78393
record_format dspace
institution Universidad Nacional de La Plata
institution_str I-19
repository_str R-120
collection SEDICI (UNLP)
language Inglés
topic Química
Física
electrochemistry
statistical physics
spellingShingle Química
Física
electrochemistry
statistical physics
Orrillo, P. A.
Santalla, S. N.
Cuerno, R.
Vázquez, L.
Ribotta, S. B.
Gassa, Liliana Mabel
Mompean, F. J.
Salvarezza, Roberto Carlos
Vela, María Elena
Morphological stabilization and KPZ scaling by electrochemically induced co-deposition of nanostructured NiW alloy films
topic_facet Química
Física
electrochemistry
statistical physics
description We have assessed the stabilizing role that induced co-deposition has in the growth of nanostructured NiW alloy films by electrodeposition on polished steel substrates, under pulsed galvanostatic conditions. We have compared the kinetic roughening properties of NiW films with those of Ni films deposited under the same conditions, as assessed by Atomic Force Microscopy. The surface morphologies of both systems are super-rough at short times, but differ at long times: while a cauliflower-like structure dominates for Ni, the surfaces of NiW films display a nodular morphology consistent with more stable, conformal growth, whose height fluctuations are in the Kardar-Parisi- Zhang universality class of rough two-dimensional interfaces. These differences are explained by the mechanisms controlling surface growth in each case: mass transport through the electrolyte (Ni) and attachment of the incoming species to the growing interface (NiW). Thus, the long-time conformal growth regime is characteristic of electrochemical induced co-deposition under current conditions in which surface kinetics is hindered due to a complex reaction mechanism. These results agree with a theoretical model of surface growth in diffusion-limited systems, in which the key parameter is the relative importance of mass transport with respect to the kinetics of the attachment reaction.
format Articulo
Articulo
author Orrillo, P. A.
Santalla, S. N.
Cuerno, R.
Vázquez, L.
Ribotta, S. B.
Gassa, Liliana Mabel
Mompean, F. J.
Salvarezza, Roberto Carlos
Vela, María Elena
author_facet Orrillo, P. A.
Santalla, S. N.
Cuerno, R.
Vázquez, L.
Ribotta, S. B.
Gassa, Liliana Mabel
Mompean, F. J.
Salvarezza, Roberto Carlos
Vela, María Elena
author_sort Orrillo, P. A.
title Morphological stabilization and KPZ scaling by electrochemically induced co-deposition of nanostructured NiW alloy films
title_short Morphological stabilization and KPZ scaling by electrochemically induced co-deposition of nanostructured NiW alloy films
title_full Morphological stabilization and KPZ scaling by electrochemically induced co-deposition of nanostructured NiW alloy films
title_fullStr Morphological stabilization and KPZ scaling by electrochemically induced co-deposition of nanostructured NiW alloy films
title_full_unstemmed Morphological stabilization and KPZ scaling by electrochemically induced co-deposition of nanostructured NiW alloy films
title_sort morphological stabilization and kpz scaling by electrochemically induced co-deposition of nanostructured niw alloy films
publishDate 2017
url http://sedici.unlp.edu.ar/handle/10915/78393
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