Interface and Structural Characterization of Buried CoSi2/Si(001) Nanoplatelets
The knowledge of the crystal shape and of the CoSi2/Si interface is essential for the theoretical modeling of these systems because these features have important influence on the electronic behavior, in particular the Schottky barrier height. Here is presented a comprehensive high resolution transmi...
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| Autores principales: | , , , , |
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| Formato: | Objeto de conferencia Resumen |
| Lenguaje: | Inglés |
| Publicado: |
2011
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| Materias: | |
| Acceso en línea: | http://sedici.unlp.edu.ar/handle/10915/145125 |
| Aporte de: |
| Sumario: | The knowledge of the crystal shape and of the CoSi2/Si interface is essential for the theoretical modeling of these systems because these features have important influence on the electronic behavior, in particular the Schottky barrier height. Here is presented a comprehensive high resolution transmission electron microscopy (HRTEM) investigation of buried CoSi2/Si nanostructures unconventionally obtained from a soft-chemistry method. In addition, the HRTEM images were studied by a strain state analysis method (GPA) [3] to calculate the 2D lattice distortion around the nanostructures. These results were compared with predictions as obtained by Finite Element Simulation (FE) to verify the induced 3D strain state. |
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