Interface and Structural Characterization of Buried CoSi2/Si(001) Nanoplatelets

The knowledge of the crystal shape and of the CoSi2/Si interface is essential for the theoretical modeling of these systems because these features have important influence on the electronic behavior, in particular the Schottky barrier height. Here is presented a comprehensive high resolution transmi...

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Detalles Bibliográficos
Autores principales: Montoro, Luciano A., Isaac, A, Giovanetti, Lisandro José, Requejo, Félix Gregorio, Ramirez, Antonio J.
Formato: Objeto de conferencia Resumen
Lenguaje:Inglés
Publicado: 2011
Materias:
Ciencias Exactas
metal silicides
electrical resistance material
Acceso en línea:http://sedici.unlp.edu.ar/handle/10915/145125
Aporte de:
SEDICI (UNLP) de Universidad Nacional de La Plata
id I19-R120-10915-145125
record_format dspace
institution Universidad Nacional de La Plata
institution_str I-19
repository_str R-120
collection SEDICI (UNLP)
language Inglés
topic Ciencias Exactas
metal silicides
electrical resistance material
spellingShingle Ciencias Exactas
metal silicides
electrical resistance material
Montoro, Luciano A.
Isaac, A
Giovanetti, Lisandro José
Requejo, Félix Gregorio
Ramirez, Antonio J.
Interface and Structural Characterization of Buried CoSi2/Si(001) Nanoplatelets
topic_facet Ciencias Exactas
metal silicides
electrical resistance material
description The knowledge of the crystal shape and of the CoSi2/Si interface is essential for the theoretical modeling of these systems because these features have important influence on the electronic behavior, in particular the Schottky barrier height. Here is presented a comprehensive high resolution transmission electron microscopy (HRTEM) investigation of buried CoSi2/Si nanostructures unconventionally obtained from a soft-chemistry method. In addition, the HRTEM images were studied by a strain state analysis method (GPA) [3] to calculate the 2D lattice distortion around the nanostructures. These results were compared with predictions as obtained by Finite Element Simulation (FE) to verify the induced 3D strain state.
format Objeto de conferencia
Resumen
author Montoro, Luciano A.
Isaac, A
Giovanetti, Lisandro José
Requejo, Félix Gregorio
Ramirez, Antonio J.
author_facet Montoro, Luciano A.
Isaac, A
Giovanetti, Lisandro José
Requejo, Félix Gregorio
Ramirez, Antonio J.
author_sort Montoro, Luciano A.
title Interface and Structural Characterization of Buried CoSi2/Si(001) Nanoplatelets
title_short Interface and Structural Characterization of Buried CoSi2/Si(001) Nanoplatelets
title_full Interface and Structural Characterization of Buried CoSi2/Si(001) Nanoplatelets
title_fullStr Interface and Structural Characterization of Buried CoSi2/Si(001) Nanoplatelets
title_full_unstemmed Interface and Structural Characterization of Buried CoSi2/Si(001) Nanoplatelets
title_sort interface and structural characterization of buried cosi2/si(001) nanoplatelets
publishDate 2011
url http://sedici.unlp.edu.ar/handle/10915/145125
work_keys_str_mv AT montorolucianoa interfaceandstructuralcharacterizationofburiedcosi2si001nanoplatelets
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AT giovanettilisandrojose interfaceandstructuralcharacterizationofburiedcosi2si001nanoplatelets
AT requejofelixgregorio interfaceandstructuralcharacterizationofburiedcosi2si001nanoplatelets
AT ramirezantonioj interfaceandstructuralcharacterizationofburiedcosi2si001nanoplatelets
bdutipo_str Repositorios
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