Cita APA (7a ed.)

Sanchez, E. Y., Represa, N. S., Mellado, D., Balbi, K. B., Acquesta, A. D., Colman Lerner, J. E., & Porta, A. A. (2018). Risk analysis of technological hazards: Simulation of scenarios and application of a local vulnerability index.

Cita Chicago Style (17a ed.)

Sanchez, Erica Yanina, Natacha Soledad Represa, Daniela Mellado, Karina Beatriz Balbi, A. D. Acquesta, Jorge Esteban Colman Lerner, y Atilio Andrés Porta. Risk Analysis of Technological Hazards: Simulation of Scenarios and Application of a Local Vulnerability Index. 2018.

Cita MLA (8a ed.)

Sanchez, Erica Yanina, et al. Risk Analysis of Technological Hazards: Simulation of Scenarios and Application of a Local Vulnerability Index. 2018.