Statistical analysis of a mixed-layer x-ray diffraction peak

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A mathematical model to describe the line shape of an x-ray diffraction peak from stacks of different layers such as, for instance, an interstratified clay mineral has been evolved. The aim was to be able to analyse the proportions of different specific stacking sequences in two-component interstrat...

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Detalles Bibliográficos
Autores principales: Rebollo Neira, Laura, Constantinides, Anthony G., Plastino, Ángel Luis, Álvarez, Alberto Guillermo, Bonetto, Rita Dominga, Iñíguez Rodríguez, Adrián Mario
Formato: Articulo
Lenguaje:Inglés
Publicado: 1997
Materias:
Ciencias Exactas
Mixed layer
Line (formation)
Chemistry
Mineralogy
Diffraction
Illite
Stacking
Clay minerals
X-ray crystallography
Mathematical model
Acceso en línea:http://sedici.unlp.edu.ar/handle/10915/122878
Aporte de:
SEDICI (UNLP) de Universidad Nacional de La Plata
Descripción
Sumario:A mathematical model to describe the line shape of an x-ray diffraction peak from stacks of different layers such as, for instance, an interstratified clay mineral has been evolved. The aim was to be able to analyse the proportions of different specific stacking sequences in two-component interstratified samples. A maximum-entropy algorithm was applied to observed powder-diffraction intensities in order to obtain the probability of each stacking sequence. Application to natural smectite-illite clays gave reasonable results.

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