Desarrollo de modelos de fallas de de sistemas electrónicos utilizando redes bayesianas

The scope of the present work is focused in the use of Belief Bayesian Nets (BBN) in order to model complex electronic system failures with hardware and built-in software. The theory of Bayesian networks can be thought as a fusion of influence diagrams and Bayes Theorem. The present analysis emphasi...

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Detalles Bibliográficos
Autor principal: Roca, José Luis
Formato: Objeto de conferencia
Lenguaje:Español
Publicado: 2011
Materias:
Ingeniería
Belief Bayesian Nets (BBN)
Fault Tree Analysis (FTA)
Conditional Probability Table (CPT)
Influence diagrams (IF)
Acceso en línea:http://sedici.unlp.edu.ar/handle/10915/121529
Aporte de:
SEDICI (UNLP) de Universidad Nacional de La Plata
id I19-R120-10915-121529
record_format dspace
institution Universidad Nacional de La Plata
institution_str I-19
repository_str R-120
collection SEDICI (UNLP)
language Español
topic Ingeniería
Belief Bayesian Nets (BBN)
Fault Tree Analysis (FTA)
Conditional Probability Table (CPT)
Influence diagrams (IF)
spellingShingle Ingeniería
Belief Bayesian Nets (BBN)
Fault Tree Analysis (FTA)
Conditional Probability Table (CPT)
Influence diagrams (IF)
Roca, José Luis
Desarrollo de modelos de fallas de de sistemas electrónicos utilizando redes bayesianas
topic_facet Ingeniería
Belief Bayesian Nets (BBN)
Fault Tree Analysis (FTA)
Conditional Probability Table (CPT)
Influence diagrams (IF)
description The scope of the present work is focused in the use of Belief Bayesian Nets (BBN) in order to model complex electronic system failures with hardware and built-in software. The theory of Bayesian networks can be thought as a fusion of influence diagrams and Bayes Theorem. The present analysis emphasizes their use in replacement of the conventional Fault Tree Analysis (FTA). A later study of software necessary to implement their application completes the proposed objective.
format Objeto de conferencia
Objeto de conferencia
author Roca, José Luis
author_facet Roca, José Luis
author_sort Roca, José Luis
title Desarrollo de modelos de fallas de de sistemas electrónicos utilizando redes bayesianas
title_short Desarrollo de modelos de fallas de de sistemas electrónicos utilizando redes bayesianas
title_full Desarrollo de modelos de fallas de de sistemas electrónicos utilizando redes bayesianas
title_fullStr Desarrollo de modelos de fallas de de sistemas electrónicos utilizando redes bayesianas
title_full_unstemmed Desarrollo de modelos de fallas de de sistemas electrónicos utilizando redes bayesianas
title_sort desarrollo de modelos de fallas de de sistemas electrónicos utilizando redes bayesianas
publishDate 2011
url http://sedici.unlp.edu.ar/handle/10915/121529
work_keys_str_mv AT rocajoseluis desarrollodemodelosdefallasdedesistemaselectronicosutilizandoredesbayesianas
bdutipo_str Repositorios
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