A 6-bit 2GS/s CMOS Time-Interleaved ADC for Analysis of Mixed-Signal Calibration Techniques
A 6-bit 2-GS/s time interleaved (TI) successive approximation register (SAR) analog-to-digital converter (ADC) is designed and fabricated in a 0.13 μm CMOS process. The architecture uses 8 time-interleaved track-and-hold amplifiers (THA), and 16 SARADC’s. Thechipincludes (i) a programmable delay cel...
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| Autores principales: | , , , , , , |
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| Formato: | conferenceObject |
| Lenguaje: | Inglés |
| Publicado: |
2022
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| Materias: | |
| Acceso en línea: | http://hdl.handle.net/11086/22937 |
| Aporte de: |
| Sumario: | A 6-bit 2-GS/s time interleaved (TI) successive approximation register (SAR) analog-to-digital converter (ADC) is designed and fabricated in a 0.13 μm CMOS process. The architecture uses 8 time-interleaved track-and-hold amplifiers (THA), and 16 SARADC’s. Thechipincludes (i) a programmable delay cell array to adjust the interleaved sampling phase, and (ii) a 12 Gbps low voltage differential signaling (LVDS) interface. These blocks make the fabricated ADC an excellent platform to evaluate mixed-signal calibration techniques, which are of great interest for application in high-speed optical systems. Measurements of the fabricated ADC show 33.9 dB of peak signal-to-noise-and-distortion ratio (SNDR) and 192 mW of power consumption at 1.2 V |
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