Monte Carlo simulation of characteristic secondary fluorescence in electron probe microanalysis of homogeneous samples using the splitting technique

Electron probe microanalysis (EPMA) is based on the comparison of characteristic intensities induced by monoenergetic electrons. When the electron beam ionizes inner atomic shells and these ionizations cause the emission of characteristic X-rays, secondary fluorescence can occur, originating from io...

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Autores principales: Petaccia Trobatto, Mauricio Germán, Seguí Osorio, Silvina Inda María, Castellano, Gustavo Eugenio
Formato: article
Lenguaje:Inglés
Publicado: 2022
Materias:
EPMA
Characteristic fluorescence enhancement
Monte Carlo simulation
Variance reduction
Acceso en línea:http://hdl.handle.net/11086/27481
http://dx.doi.org/10.1017/S1431927615000495
https://doi.org/10.1017/S1431927615000495
http://dx.doi.org/10.1017/S1431927615000495
Aporte de:
Repositorio Digital Universitario (UNC) de Universidad Nacional de Córdoba
id I10-R141-11086-27481
record_format dspace
institution Universidad Nacional de Córdoba
institution_str I-10
repository_str R-141
collection Repositorio Digital Universitario (UNC)
language Inglés
topic EPMA
Characteristic fluorescence enhancement
Monte Carlo simulation
Variance reduction
spellingShingle EPMA
Characteristic fluorescence enhancement
Monte Carlo simulation
Variance reduction
Petaccia Trobatto, Mauricio Germán
Seguí Osorio, Silvina Inda María
Castellano, Gustavo Eugenio
Monte Carlo simulation of characteristic secondary fluorescence in electron probe microanalysis of homogeneous samples using the splitting technique
topic_facet EPMA
Characteristic fluorescence enhancement
Monte Carlo simulation
Variance reduction
description Electron probe microanalysis (EPMA) is based on the comparison of characteristic intensities induced by monoenergetic electrons. When the electron beam ionizes inner atomic shells and these ionizations cause the emission of characteristic X-rays, secondary fluorescence can occur, originating from ionizations induced by X-ray photons produced by the primary electron interactions. As detectors are unable to distinguish the origin of these characteristic X-rays, Monte Carlo simulation of radiation transport becomes a determinant tool in the study of this fluorescence enhancement. In this work, characteristic secondary fluorescence enhancement in EPMA has been studied by using the splitting routines offered by PENELOPE 2008 as a variance reduction alternative. This approach is controlled by a single parameter NSPLIT, which represents the desired number of X-ray photon replicas. The dependence of the uncertainties associated with secondary intensities on NSPLIT was studied as a function of the accelerating voltage and the sample composition in a simple binary alloy in which this effect becomes relevant. The achieved efficiencies for the simulated secondary intensities bear a remarkable improvement when increasing the NSPLIT parameter; although in most cases an NSPLIT value of 100 is sufficient, some less likely enhancements may require stronger splitting in order to increase the efficiency associated with the simulation of secondary intensities.
format article
author Petaccia Trobatto, Mauricio Germán
Seguí Osorio, Silvina Inda María
Castellano, Gustavo Eugenio
author_facet Petaccia Trobatto, Mauricio Germán
Seguí Osorio, Silvina Inda María
Castellano, Gustavo Eugenio
author_sort Petaccia Trobatto, Mauricio Germán
title Monte Carlo simulation of characteristic secondary fluorescence in electron probe microanalysis of homogeneous samples using the splitting technique
title_short Monte Carlo simulation of characteristic secondary fluorescence in electron probe microanalysis of homogeneous samples using the splitting technique
title_full Monte Carlo simulation of characteristic secondary fluorescence in electron probe microanalysis of homogeneous samples using the splitting technique
title_fullStr Monte Carlo simulation of characteristic secondary fluorescence in electron probe microanalysis of homogeneous samples using the splitting technique
title_full_unstemmed Monte Carlo simulation of characteristic secondary fluorescence in electron probe microanalysis of homogeneous samples using the splitting technique
title_sort monte carlo simulation of characteristic secondary fluorescence in electron probe microanalysis of homogeneous samples using the splitting technique
publishDate 2022
url http://hdl.handle.net/11086/27481
http://dx.doi.org/10.1017/S1431927615000495
https://doi.org/10.1017/S1431927615000495
http://dx.doi.org/10.1017/S1431927615000495
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