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LEADER |
01438cam a22004817a 4500 |
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005735 |
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armpuni |
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20160923155442.0 |
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160923s2001####xx#a##########000#0#und#d |
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|a 0201610914
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|a armpuni
|c armpuni
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|a en
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|a 535-34
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1 |
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|a Cullity, B.D.
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1 |
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|a Elements of X-Ray diffraction /
|c B.D. Cullity, S.R. Stock
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250 |
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|a 3th. ed.
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260 |
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|a New Jersey :
|b Prentice Hall,
|c c2001
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300 |
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|a 664 p.;
|c 24 cm.
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650 |
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7 |
|a crystal quality
|2 LEMB
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650 |
|
7 |
|a crystal structure
|2 LEMB
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650 |
|
7 |
|a diffraction
|2 LEMB
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650 |
|
7 |
|a diffractometer measurements
|2 LEMB
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650 |
|
7 |
|a difraccion
|2 LEMB
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650 |
|
7 |
|a geometria de cristales
|2 LEMB
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650 |
|
7 |
|a geometry of crystals
|2 LEMB
|
650 |
|
7 |
|a laue photographs
|2 LEMB
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650 |
|
7 |
|a olycrystalline aggregates
|2 LEMB
|
650 |
|
7 |
|a phase identification
|2 LEMB
|
650 |
|
7 |
|a phase
|x diagram determination
|2 LEMB
|
650 |
|
7 |
|a polymers
|2 LEMB
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650 |
|
7 |
|a powder photographs
|2 LEMB
|
650 |
|
7 |
|a quantitative phase analysis
|2 LEMB
|
650 |
|
7 |
|a rayos x
|2 LEMB
|
650 |
|
7 |
|a single crystals
|2 LEMB
|
650 |
|
7 |
|a small angle scattering
|2 LEMB
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650 |
|
7 |
|a stress measurement
|2 LEMB
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650 |
|
7 |
|a transmission electron microscopy
|2 LEMB
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650 |
|
7 |
|a x
|x ray diffraction
|2 LEMB
|
650 |
|
7 |
|a x
|x ray
|2 LEMB
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700 |
1 |
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|a Stock, S.R.
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942 |
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|c LB
|2 cdu
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945 |
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|a JPA
|d 2005-03-30
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999 |
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|c 5734
|d 6909
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