Correction of aberrations in an optical correlator by using it as a point diffraction interferometer

In VanderLugt type correlators, the input scene and the filter could be implemented onto twisted liquid crystal displays (LCD's). The modulator used to display the scene and the elements placed before the filter usually introduce phase aberrations. These aberrations have an important influence...

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Autor principal: Iemmi, Claudio César
Otros Autores: Moreno, A., Nicolás, J., Campos, J.
Formato: Acta de conferencia Capítulo de libro
Lenguaje:Inglés
Publicado: 2004
Acceso en línea:Registro en Scopus
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100 1 |a Iemmi, Claudio César 
245 1 0 |a Correction of aberrations in an optical correlator by using it as a point diffraction interferometer 
260 |c 2004 
270 1 0 |m Iemmi, C.; Departamento de Física, Fac. de Ciencias Exactas y Naturales, Universidad de Buenos Aires, (1428) Buenos Aires, Argentina 
504 |a Liu, H.K., Davis, J.A., Lilly, R.A., Optical data processing properties of a liquid crystal television spatial light modulator (1985) Opt. Lett., 10, pp. 635-637 
504 |a Soutar, C., Wang, Z.Q., Cattwright, C.M., Gillespie, W.A., Real time optical intensity correlator using photorefractive BSO and a liquid crystal television (1992) J. Mod. Opt., 39, pp. 761-769 
504 |a Nicolás, J., Campos, J., Iemmi, C., Moreno, I., Yzuel, M.J., Convergent optical correlator alignment based on frequency filtering (2002) Appl. Opt., 41, pp. 1505-1514 
504 |a VanderLugt, A., The effects of small displacements of spatial filters (1967) Appl. Opt., 6, pp. 1221-1225 
504 |a Cai, L., Jin, Y., Zhou, S., Yeh, P., Marzwell, N., Liu, H., Translational sensitivity adjustable compact optical correlators and its application for fingerprint recognition (1996) Opt. Eng., 35, pp. 415-422 
504 |a Usategui, M.M., Monroe, S.E., Juday, R.D., Automated self-alignment procedure for optical correlators (1997) Opt. Eng., 36, pp. 1782-1791 
504 |a Tudela, J.P., Usategui, M.M., Juvells, I., Vallmitjana, S., Analisis of the influence of aberrated convergent Fourier transform setups in optical correlation (2000) Opt. Comm., 184, pp. 345-355 
504 |a Marquez, A., Iemmi, C., Moreno, I., Davis, J.A., Campos, J., Yzuel, M.J., Quantitative predictions of the modulation behavior of twisted nematic liquid crystal displays based on a simple physical model (2001) Opt. Eng., 40, pp. 2558-2564 
504 |a Linnik, V., Simple interferometer for the investigation of optical systems (1994) C. R. Acad. Sci. USSR, 1, pp. 208-210 
504 |a Mercer, C., Creath, K., Liquid-crystal point-diffraction interferometer (1994) Opt. Lett., 19, pp. 916-918 
504 |a Caulfield, H.J., Schamschula, M.P., Zhang, L., Maximal limits on the information throughput of spatial light modulators (1995) Opt. Lett., 20, pp. 1803-1805 
504 |a Zernike, F., Das Phasenkontrastverfahren bei der Mokroskopischen Beobachtung (1935) Z. Tech. Phys., 16, p. 454 
504 |a Creath, K., Phase measurement interferometry techniques (1988) Progress in Optics, 26, pp. 349-393. , ed. by E. Wolf (Elsevier, Amsterdam) 
504 |a Malacara, D., (1978) Optical Shop Testing, , John Wiley & Sons, New YorkA4 - SPIE - The International Society for Optical Engineering 
506 |2 openaire  |e Política editorial 
520 3 |a In VanderLugt type correlators, the input scene and the filter could be implemented onto twisted liquid crystal displays (LCD's). The modulator used to display the scene and the elements placed before the filter usually introduce phase aberrations. These aberrations have an important influence in the final correlation plane. We propose a new method to evaluate and correct in situ these aberrations by using the correlator as a point diffraction interferometer. In this work, the wave front phase distribution evaluation is performed by means of the phase shift interferometry (PSI) technique. We present the theory on which the method is based and the experimental results obtained by applying it in a convergent correlator.  |l eng 
593 |a Departamento de Física, Fac. de Ciencias Exactas y Naturales, Universidad de Buenos Aires, (1428) Buenos Aires, Argentina 
593 |a Departamento de Física, Univ. Autónoma de Barcelona, 08193 Bellaterra, Spain 
690 1 0 |a INTERFEROMETRY 
690 1 0 |a OPTICAL CORRELATORS 
690 1 0 |a PHASE MEASUREMENT 
690 1 0 |a FOURIER TRANSFORMS 
690 1 0 |a IMAGE PROCESSING 
690 1 0 |a INTERFEROMETERS 
690 1 0 |a LIGHT PROPAGATION 
690 1 0 |a LIQUID CRYSTAL DISPLAYS 
690 1 0 |a OPTICAL FILTERS 
690 1 0 |a PHASE MEASUREMENT 
690 1 0 |a DIFFRACTION INTERFEROMETERS 
690 1 0 |a OPTICAL CORRELATORS 
690 1 0 |a PHASE CONTRAST MICROSCOPES 
690 1 0 |a PHASE DISTRIBUTION 
690 1 0 |a OPTICAL SYSTEMS 
700 1 |a Moreno, A. 
700 1 |a Nicolás, J. 
700 1 |a Campos, J. 
711 2 |c Strasbourg  |d 27 April 2004 through 30 April 2004  |g Código de la conferencia: 64035 
773 0 |d 2004  |g v. 5457  |h pp. 589-597  |p Proc SPIE Int Soc Opt Eng  |n Proceedings of SPIE - The International Society for Optical Engineering  |x 0277786X  |t Optical Metrology in Production Engineering 
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856 4 0 |u https://doi.org/10.1117/12.545753  |y DOI 
856 4 0 |u https://hdl.handle.net/20.500.12110/paper_0277786X_v5457_n_p589_Iemmi  |y Handle 
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