Two-beam interferometers: A classification which takes into account multiple localizations
Two beam interferometers are traditionally classified by the method used to separate the beams. This classification is suitable for considering localizations when the source is incoherent and continuous since an amplitude division interferometer yields the classical localization plane while a wavefr...
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| Formato: | Capítulo de libro |
| Lenguaje: | Inglés |
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Urban und Fischer Verlag Jena
2001
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| Acceso en línea: | Registro en Scopus DOI Handle Registro en la Biblioteca Digital |
| Aporte de: | Registro referencial: Solicitar el recurso aquí |
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| 040 | |a Scopus |b spa |c AR-BaUEN |d AR-BaUEN | ||
| 100 | 1 | |a Comastri, Silvia Ana Elva | |
| 245 | 1 | 0 | |a Two-beam interferometers: A classification which takes into account multiple localizations |
| 260 | |b Urban und Fischer Verlag Jena |c 2001 | ||
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| 504 | |a Malacara, D., Servin, M., Malacara, Z., (1998) Interferogram Analysis for Optical Testing, , Marcel Dekker, New York | ||
| 504 | |a Simon, J.M., Comastri, S.A., Localization of interference fringes (1980) Am. J. Phys., 48, pp. 665-668 | ||
| 504 | |a Simon, J.M., Comastri, S.A., Fringe localization depth (1987) Appl. Opt., 26, pp. 5125-5129 | ||
| 504 | |a Simon, J.M., Comastri, S.A., Interferometers: Equivalent sine condition (1988) Appl. Opt., 27, pp. 4725-4730 | ||
| 504 | |a Simon, J.M., Simon, M.C., Echarri, R.M., Garea, M.T., Fringe localization in interferometers illuminated by a succession of incoherent line sources (1998) J. Mod. Opt., 45, pp. 2245-2254 | ||
| 504 | |a Comastri, S.A., Simon, J.M., Multilocalization and van Cittert-Zernike theorem. 1. Theory (2000) J. Opt. Soc. Am. A, 17, pp. 1265-1276 | ||
| 504 | |a Simon, J.M., Comastri, S.A., Multilocalization and van Cittert-Zernike theorem. 2. Application of the Wollaston prism (2000) J. Opt. Soc. Am. A, 17, pp. 1277-1283 | ||
| 504 | |a Simon, J.M., Echarri, R.M., Walsh, P.A., Multilocation of fringes in the Mach-Zender interferometer (2000) Optik, 111, pp. 307-309 | ||
| 504 | |a Simon, J.M., Echarri, R.M., Simon, M.C., Garea, M.T., Fringe localization in wavefront division interferometers (2001) Optik, 112, pp. 255-258 | ||
| 504 | |a Simon, J.M., Comastri, S.A., Two beam interferometer illuminated by a non-monochromatic incoherent periodic source: 1. Young's interferometer (2001) Proc. SPIE, 4419, pp. 231-234. , 4th Iberoamerican Meeting on Optics and 7th Latin American Meeting on Optics, Lasers and their Applications | ||
| 504 | |a Simon, J.M., Comastri, S.A., Echarri, R.M., The Mach-Zender interferometer: Examination of a volume by non-classical localization plane shifting (2001) Pure Appl. Opt., 4, pp. 242-249 | ||
| 504 | |a Simon, J.M., Comastri, S.A., Echarri, R.M., Shifting of localization planes in optical testing: Application to a shearing interferometer (2001) Appl. Opt., 40, pp. 4999-5010 | ||
| 504 | |a Comastri, S.A., Simon, J.M., Two beam interferometer illuminated by a non-monochromatic incoherent periodic source: 2. Wollaston prism (2001) Proc. SPIE, 4419, pp. 235-238. , 4th Iberoamerican Meeting on Optics and 7th Latin American Meeting on Optics, Lasers and their Applications | ||
| 504 | |a Malacara, D., (1978) Optical shop testing, , John Wiley and Sons Inc, New York | ||
| 504 | |a Born, M., Wolf, B., (1987) Principles of Optics, , Pergamon Press, London | ||
| 506 | |2 openaire |e Política editorial | ||
| 520 | 3 | |a Two beam interferometers are traditionally classified by the method used to separate the beams. This classification is suitable for considering localizations when the source is incoherent and continuous since an amplitude division interferometer yields the classical localization plane while a wavefront division one yields no fringes. However when the source is incoherent and periodic and the symmetry is plane there can be multiple localization planes and these cannot be easily analysed using this classification. In the present paper these planes are taken into account classifying two beam interferometers as those where the 'effective interfering sources' are the images of the source of light and those where they are not. The latter either yield no fringes or non-localized ones while the former yield several planes with straight, sinusoidal, localized fringes provided certain requirements are fulfilled. One of these is the equivalent sine condition which is here derived for any observation plane. Thus interferometers of the first class are further subdivided in two: those where the equivalent sine condition is verified on every observation plane and those where it is not. Experimental results illustrating the validity of the theoretical predictions are shown. |l eng | |
| 593 | |a Laboratorio De Optica, Facultad De Ciencias Exactas Y Naturales, Universidad De Buenos Aires, (1428) Buenos Aires, Argentina | ||
| 593 | |a Consejo Nacional De Investigaciones Cientificas Y Técnicas, Argentina | ||
| 690 | 1 | 0 | |a FRINGE LOCALIZATION |
| 690 | 1 | 0 | |a TWO BEAM INTERFEROMETERS |
| 690 | 1 | 0 | |a ABERRATIONS |
| 690 | 1 | 0 | |a ELECTROMAGNETIC WAVE POLARIZATION |
| 690 | 1 | 0 | |a LIGHT INTERFERENCE |
| 690 | 1 | 0 | |a NUMERICAL ANALYSIS |
| 690 | 1 | 0 | |a WAVEFRONTS |
| 690 | 1 | 0 | |a FRINGE LOCALIZATION |
| 690 | 1 | 0 | |a TWO BEAM INTERFEROMETERS |
| 690 | 1 | 0 | |a INTERFEROMETERS |
| 700 | 1 | |a Simon, J.M. | |
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