Optimization, tolerance analysis and implementation of a Stokes polarimeter based on the conical refraction phenomenon
Recently, we introduced the basic concepts behind a new polarimeter device based on conical refraction (CR), which presents several appealing features compared to standard polarimeters. To name some of them, CR polarimeters retrieve the polarization state of an input light beam with a snapshot measu...
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OSA - The Optical Society
2015
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| LEADER | 12123caa a22011057a 4500 | ||
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| 001 | PAPER-13883 | ||
| 003 | AR-BaUEN | ||
| 005 | 20250513095655.0 | ||
| 008 | 190411s2015 xx ||||fo|||| 00| 0 eng|d | ||
| 024 | 7 | |2 scopus |a 2-s2.0-84981332599 | |
| 040 | |a Scopus |b spa |c AR-BaUEN |d AR-BaUEN | ||
| 100 | 1 | |a Peinado, A. | |
| 245 | 1 | 0 | |a Optimization, tolerance analysis and implementation of a Stokes polarimeter based on the conical refraction phenomenon |
| 260 | |b OSA - The Optical Society |c 2015 | ||
| 504 | |a Azzam, R.M.A., Bashara, N.M., (1977) Ellipsometry and Polarized Light, , North-Holland Publishing Company | ||
| 504 | |a Escobar, V.A., Rangel, J.R., Pérez, N.V., Andrade, G., Dávila, J.L., (2012) Infrared Spectroscopy - Materials Sciencie, Enginneering and Technology, , Intech, Chap. 9 | ||
| 504 | |a Do, N.L., Garcia-Caurel, E., Bererd, N., Moncoffre, N., Gorse-Pomonti, D., Determination of thicknesses of oxide films grown on titanium under argon irradiation by spectroscopic ellipsometry (2014) J. Nucl. Mater, 447 (1-3), pp. 197-207 | ||
| 504 | |a Lizana, A., Foldyna, M., Stchakovsky, M., Georges, B., David, N., Garcia-Caurel, E., Enhanced sensitivity to dielectric function and thickness of absorbing thin film by combining total internal reflection ellipsometry with standard ellipsometry and reflectometry (2013) J. Phys. D Appl. Phys, 46 (10) | ||
| 504 | |a Twietmeyer, K.M., Chipman, R.A., Elsner, A.E., Zhao, Y., VanNasdale, D., Mueller matrix retinal imager with optimized polarization conditions (2008) Opt. Express, 16 (26), pp. 21339-21354 | ||
| 504 | |a Antonelli, M.R., Pierangelo, A., Novikova, T., Validire, P., Benali, A., Gayet, B., De Martino, A., Mueller matrix imaging of human colon tissue for cancer diagnostics: How Monte Carlo modeling can help in the interpretation of experimental data (2010) Opt. Express, 18 (10), pp. 10200-10208 | ||
| 504 | |a Uribe-Patarroyo, N., Alvarez-Herrero, A., Heredero, R.L., Del Toro, J.C., López, A.C., Domingo, V., Gasent, J.L., Martínez, V., IMaX: A polarimeter based on liquid crystal variable retarders for an aerospace mission (2008) Phys. Status Solidi C, 5 (5), pp. 1041-1045 | ||
| 504 | |a Elmore, D.F., Lites, B.W., Tomczyk, S., Skumanich, A., Dunn, R.B., Schuenke, J.A., Streander, K.V., Lacey, L.B., Advanced Stokes polarimeter: A new instrument for solar magnetic field research (1992) Proc. SPIE, 1746 | ||
| 504 | |a Chipman, R.A., Polarimetry (1995) Handbook of Optics, , M. Bass, ed., McGraw-Hill | ||
| 504 | |a Tyo, J.S., Goldstein, D.L., Chenault, D.B., Shaw, J.A., Review of passive imaging polarimetry for remote sensing applications (2006) Appl. Opt, 45 (22), pp. 5453-5469 | ||
| 504 | |a Peinado, A., Lizana, A., Vidal, J., Iemmi, C., Campos, J., Optimization and performance criteria of a Stokes polarimeter based on two variable retarders (2010) Opt. Express, 18 (10), pp. 9815-9830 | ||
| 504 | |a Sabatke, D.S., Descour, M.R., Dereniak, E.L., Sweatt, W.C., Kemme, S.A., Phipps, G.S., Optimization of retardance for a complete Stokes polarimeter (2000) Opt. Lett, 25 (11), pp. 802-804 | ||
| 504 | |a Pezzaniti, J.L., Chipman, R.A., Mueller matrix imaging polarimetry (1995) Opt. Eng, 34 (6), pp. 1558-1568 | ||
| 504 | |a Raman, P., Fuller, K., Gregory, D., Newchurch, M., Christy, J., Broadband (UV-VIS-NIR) Mueller matrix polarimeter (2011) Proc. SPIE, 8160 | ||
| 504 | |a Savenkova, S., Muttiahb, R., Oberemoka, E., Klimova, A., Incomplete active polarimetry: Measurement of the block-diagonal scattering matrix (2011) J. of Quant. Spec. and Rad. Trans, 112 (11), pp. 1796-1802 | ||
| 504 | |a Garcia-Caurel, E., De Martino, A., Drevillon, B., Spectroscopic Mueller polarimeter based on liquid crystal devices (2004) J. Thin Solid Films, 455-456, pp. 120-123 | ||
| 504 | |a Gendre, L., Foulonneau, A., Bigué, L., Imaging linear polarimetry using a single ferroelectric liquid crystal modulator (2010) Appl. Opt, 49 (25), pp. 4687-4699 | ||
| 504 | |a Peinado, A., Lizana, A., Vidal, J., Iemmi, C., Campos, J., Optimized Stokes polarimeters based on a single twisted nematic liquid-crystal device for the minimization of noise propagation (2011) Appl. Opt, 50 (28), pp. 5437-5445 | ||
| 504 | |a Compain, E., Drevillon, B., Broadband division-of-amplitude polarimeter based on uncoated prisms (1998) Appl. Opt, 37 (25), pp. 5938-5944 | ||
| 504 | |a Peinado, A., Turpin, A., Lizana, A., Fernández, E., Mompart, J., Campos, J., A method for polarization metrology based on the conical refraction (2013) Opt. Lett, 38 (20), pp. 4100-4103 | ||
| 504 | |a Pezzaniti, J.L., Chenault, D.B., A division of aperture MWIR imaging polarimeter (2005) Proc. SPIE, 5888 | ||
| 504 | |a Berry, M.V., Jeffrey, M.R., Conical diffraction: Hamilton's diabolical point at the heart of crystal optics (2007) Prog. Opt, 50, pp. 13-50 | ||
| 504 | |a Belskii, A.M., Khapalyuk, A.P., Internal conical refraction of bounded light beams in biaxial crystals (1978) Opt. Spectrosc, 44, pp. 436-439 | ||
| 504 | |a Kalkandjiev, T.K., Bursukova, M.A., Conical refraction: An experimental introduction (2008) Proc. SPIE, 6994 | ||
| 504 | |a Turpin, A., Loiko, Y.V., Kalkandjiev, T.K., Tomizawa, H., Mompart, J., Wave-vector and polarization dependence of conical refraction (2013) Opt. Express, 21 (4), pp. 4503-4511 | ||
| 504 | |a Turpin, A., Loiko, Y.V., Kalkandjiev, T.K., Mompart, J., Multiple rings formation in cascaded conical refraction (2013) Opt. Lett, 38 (9), pp. 1455-1457 | ||
| 504 | |a Turpin, A., Loiko, Y., Kalkandjiev, T.K., Mompart, J., Free-space optical polarization demultiplexing and multiplexing by means of conical refraction (2012) Opt. Lett, 37 (20), pp. 4197-4199 | ||
| 504 | |a Loiko, Y.V., Sokolovskii, G.S., Carnegie, D., Turpin, A., Mompart, J., Rafailov, E.U., Laser beams with conical refraction patterns (2014) Proc. SPIE, 8960 | ||
| 504 | |a O'Dwyer, D.P., Phelan, C.F., Ballantine, K.E., Rakovich, Y.P., Lunney, J.G., Donegan, J.F., Conical diffraction of linearly polarized light controls the angular position of a microscopic object (2010) Opt. Exp, 18 (26), pp. 27319-27326 | ||
| 504 | |a Taylor, P., (1996) Theory and Applications of Numerical Analysis, , Academic | ||
| 504 | |a Tyo, J.S., Design of optimal polarimeters: Maximization of signal-to-noise ratio and minimization of systematic error (2002) Appl. Opt, 41 (4), pp. 619-630 | ||
| 504 | |a Goudail, F., Noise minimization and equalization for Stokes polarimeters in the presence of signal-dependent Poisson shot noise (2009) Opt. Lett, 34 (5), pp. 647-649 | ||
| 504 | |a Lara, D., Paterson, C., Stokes polarimeter optimization in the presence of shot and Gaussian noise (2009) Opt. Express, 17 (23), pp. 21240-21249 | ||
| 504 | |a Anna, G., Goudail, F., Optimal Mueller matrix estimation in the presence of Poisson shot noise (2012) Opt. Express, 20 (19), pp. 21331-21340 | ||
| 504 | |a Sabatke, D.S., Locke, A.M., Descour, M.R., Sweatt, W.C., Garcia, J.P., Dereniak, E.L., Kemme, S.A., Phipps, G.S., Figures of merit for complete Stokes polarimeter optimization (2000) Proc. SPIE, 4133, pp. 75-81 | ||
| 504 | |a Chironi, E., Iemmi, C., Bounding the relative errors associated with a complete Stokes polarimeter (2014) J. Opt. Soc. Am. A, 31 (1), pp. 75-80 | ||
| 504 | |a Peinado, A., Lizana, A., Campos, J., Optimization and tolerance analysis of a polarimeter with ferroelectric liquid crystals (2013) Appl. Opt, 52 (23), pp. 5748-5757 | ||
| 504 | |a Kemp, J.C., Barbour, M.S., A photoelastic-modulator polarimeter at Pine Mountain Observatory (1981) Publ. Astron. Soc. Pac, 93, pp. 521-525 | ||
| 504 | |a Arteaga, O., Freudenthal, J., Wang, B., Kahr, B., Mueller matrix polarimetry with four photoelastic modulators: Theory and calibration (2012) Appl. Opt, 51 (28), pp. 6805-6817 | ||
| 504 | |a Goldstein, G., (2003) Polarized Light, , Marcel Dekker | ||
| 504 | |a Azzam, R.M.A., Elminyawi, I.M., El-Saba, A.M., General analysis and optimization of the four-detector photopolarimeter (1988) J. Opt. Soc. Am. A, 5 (5), pp. 681-689 | ||
| 504 | |a De Martino, A., Kim, Y.K., Garcia-Caurel, E., Laude, B., Drévillon, B., Optimized Mueller polarimeter with liquid crystals (2003) Opt. Lett, 28 (8), pp. 616-618 | ||
| 504 | |a Neumann, L., Hegedus, R., Horvath, G., Garcia, R., Applications for high precision imaging polarimetry (2008) Proceedings of the Fourth Eurographics Conference on Computational Aesthetics in Graphics, Visualization and Imaging, pp. 89-97. , Eurographics Association | ||
| 504 | |a Compain, E., Poirier, S., Drevillon, B., General and self-consistent method for the calibration of polarization modulators, polarimeters, and mueller-matrix ellipsometers (1999) Appl. Opt, 38 (16), pp. 3490-3502 | ||
| 504 | |a Huard, S., (1994) Polarisation de la Lumière, , Masson | ||
| 504 | |a Lu, S.-Y., Chipman, R.A., Interpretation of Mueller matrices based on polar decomposition (1996) J. Opt. Soc. Am. A, 13 (5), pp. 1106-1113 | ||
| 504 | |a Kalkandjiev, T.K., Bursukova, M.A., Conical refraction: An experimental introduction (2008) Proc. SPIE, 6994 | ||
| 504 | |a Smith, M.H., Woodruff, J.B., Howe, J.D., Beam wander considerations in imaging polarimetry (1999) Proc. SPIE, 3754, pp. 50-54 | ||
| 504 | |a Peinado, A., Lizana, A., Campos, J., Use of ferroelectric liquid crystal panels to control state and degree of polarization in light beams (2014) Opt. Lett, 39 (3), pp. 659-662 | ||
| 506 | |2 openaire |e Política editorial | ||
| 520 | 3 | |a Recently, we introduced the basic concepts behind a new polarimeter device based on conical refraction (CR), which presents several appealing features compared to standard polarimeters. To name some of them, CR polarimeters retrieve the polarization state of an input light beam with a snapshot measurement, allow for substantially enhancing the data redundancy without increasing the measuring time, and avoid instrumental errors owing to rotating elements or phase-to-voltage calibration typical from dynamic devices. In this article, we present a comprehensive study of the optimization, robustness and parameters tolerance of CR based polarimeters. In addition, a particular CR based polarimetric architecture is experimentally implemented, and some concerns and recommendations are provided. Finally, the implemented polarimeter is experimentally tested by measuring different states of polarization, including fully and partially polarized light. ©2015 Optical Society of America. |l eng | |
| 593 | |a Departament de Física, Universitat Autònoma de Barcelona, Bellaterra, 08193, Spain | ||
| 593 | |a Departamento de Física, FCEN, Universidad de Buenos Aires, Buenos Aires, 1428, Argentina | ||
| 690 | 1 | 0 | |a FITS AND TOLERANCES |
| 690 | 1 | 0 | |a LIGHT POLARIZATION |
| 690 | 1 | 0 | |a POLARIZATION |
| 690 | 1 | 0 | |a REFRACTION |
| 690 | 1 | 0 | |a CONICAL REFRACTION |
| 690 | 1 | 0 | |a INSTRUMENTAL ERROR |
| 690 | 1 | 0 | |a PARTIALLY POLARIZED LIGHT |
| 690 | 1 | 0 | |a POLARIZATION STATE |
| 690 | 1 | 0 | |a SNAPSHOT MEASUREMENT |
| 690 | 1 | 0 | |a STATES OF POLARIZATIONS |
| 690 | 1 | 0 | |a STOKES POLARIMETER |
| 690 | 1 | 0 | |a TOLERANCE ANALYSIS |
| 690 | 1 | 0 | |a POLARIMETERS |
| 700 | 1 | |a Lizana, A. | |
| 700 | 1 | |a Turpín, A. | |
| 700 | 1 | |a Iemmi, Claudio César | |
| 700 | 1 | |a Kalkandjiev, T.K. | |
| 700 | 1 | |a Mompart, J. | |
| 700 | 1 | |a Campos, J. | |
| 773 | 0 | |d OSA - The Optical Society, 2015 |g v. 23 |h pp. 5636-5652 |k n. 5 |p Opt. Express |x 10944087 |w (AR-BaUEN)CENRE-8983 |t Optics Express | |
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