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| LEADER |
00707nab a22002537a 4500 |
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A0003917 |
| 003 |
AR-OvUNE |
| 005 |
20180807210940.0 |
| 006 |
a||||| 00| 0 |
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120910n xx ||||| 00| 0 engd |
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|a 0018-9235
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| 040 |
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|a AR-OvUNE
|c AR-OvUNE
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| 100 |
1 |
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|a Miranda, Miguel
|9 20073
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| 245 |
1 |
0 |
|a When every atom counts.
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| 260 |
2 |
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|b Institute of Electrical and Electronics Engineers
|a New York, NY
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| 300 |
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|a p.30-35
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| 650 |
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4 |
|a CHIPS
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| 650 |
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4 |
|a MANUFACTURA ELECTRONICA
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| 650 |
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4 |
|a VARIABILIDAD
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| 773 |
0 |
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|t IEEE Spectrum
|g v.49, no.7, Jul. 2012
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| 942 |
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|c AN
|2 udc
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| 945 |
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|c Registro migrado.
|a bcr
|b Nro. acceso original: A0003917
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| 999 |
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|c 10353
|d 10353
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