Microstructural characterization of materials /

The concept of microstructure - Diffraction analysis of crystal structure - Optical microscopy - Transmission electron microscopy - Scanning electron microscopy - Microanalysis in electron microscopy - Scanning probe microscopy and related techniques - Chemical analysis of surface composition - Quan...

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Detalles Bibliográficos
Autor principal: Brandon, David
Otros Autores: Kaplan, Wayne D.
Formato: Libro
Lenguaje:Inglés
Publicado: West Sussex : John Wiley and Sons, 2008.
Edición:2nd ed.
Materias:
MICROESTRUCTURAS
MICROSCOPIA OPTICA
MICROSCOPIA ELECTRONICA
MATERIALES
Aporte de:Registro referencial: Solicitar el recurso aquí
Bibliotecas (ING-UNLP) de Universidad Nacional de La Plata
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245 1 0 |a Microstructural characterization of materials /   |c David Brandon; Wayne D. Kaplan. 
250 |a 2nd ed. 
260 |a West Sussex :   |b John Wiley and Sons,   |c 2008. 
300 |a xiv; 536 p. :   |b figuras 
520 2 |a The concept of microstructure - Diffraction analysis of crystal structure - Optical microscopy - Transmission electron microscopy - Scanning electron microscopy - Microanalysis in electron microscopy - Scanning probe microscopy and related techniques - Chemical analysis of surface composition - Quantitative and tomographic analysis of microstructure - Appendices. 
650 4 |a MICROESTRUCTURAS  |9 269388 
650 4 |a MICROSCOPIA OPTICA  |9 302662 
650 4 |a MICROSCOPIA ELECTRONICA  |9 268950 
650 4 |a MATERIALES  |9 262896 
700 1 |a Kaplan, Wayne D.  |9 305043 
929 |a 41538 COM Tesoro Nacional 2015 
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999 |a GEB  |c 19019  |d 19019 

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