Materials characterization : introduction to microscopic and spectroscopic methods /
Ligh microscopy - X-Ray diffraction methods - Transmission electron microscopy - Scanning electron microscopy - Scanning probe microscopy - X-Ray spectroscopy for elemental analysis - Electron spectroscopy for surface analysis - Secondary ion mass spectrometry for surface analysis - Vibrational spec...
Guardado en:
| Autor principal: | Leng, Yang |
|---|---|
| Formato: | Libro |
| Lenguaje: | Inglés |
| Publicado: |
Weinheim :
Wiley-VCH,
2013.
|
| Edición: | 2nd ed. |
| Materias: | |
| Aporte de: | Registro referencial: Solicitar el recurso aquí |
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