Materials characterization : introduction to microscopic and spectroscopic methods /

Ligh microscopy - X-Ray diffraction methods - Transmission electron microscopy - Scanning electron microscopy - Scanning probe microscopy - X-Ray spectroscopy for elemental analysis - Electron spectroscopy for surface analysis - Secondary ion mass spectrometry for surface analysis - Vibrational spec...

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Detalles Bibliográficos
Autor principal: Leng, Yang
Formato: Libro
Lenguaje:Inglés
Publicado: Weinheim : Wiley-VCH, 2013.
Edición:2nd ed.
Materias:
RAYOS X
MICROSCOPIA
ESPECTROSCOPIA
Aporte de:Registro referencial: Solicitar el recurso aquí
Bibliotecas (ING-UNLP) de Universidad Nacional de La Plata
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