Advanced Field-Solver Techniques for RC Extraction of Integrated Circuits

Resistance and capacitance (RC) extraction is an essential step in modeling the interconnection wires and substrate coupling effect in nanometer-technology integrated circuits (IC). The field-solver techniques for RC extraction guarantee the accuracy of modeling, and are becoming increasingly import...

Descripción completa

Guardado en:
Detalles Bibliográficos
Autor principal: Yu, Wenjian
Otros Autores: Wang, Xiren
Formato: Libro electrónico
Lenguaje:Inglés
Publicado: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2014.
Materias:
Acceso en línea:http://dx.doi.org/10.1007/978-3-642-54298-5
Aporte de:Registro referencial: Solicitar el recurso aquí
LEADER 03284Cam#a22004575i#4500
001 INGC-EBK-000737
003 AR-LpUFI
005 20220927110056.0
007 cr nn 008mamaa
008 140421s2014 gw | s |||| 0|eng d
020 |a 9783642542985 
024 7 |a 10.1007/978-3-642-54298-5  |2 doi 
050 4 |a TK7888.4 
072 7 |a TJFC  |2 bicssc 
072 7 |a TEC008010  |2 bisacsh 
100 1 |a Yu, Wenjian.  |9 261869 
245 1 0 |a Advanced Field-Solver Techniques for RC Extraction of Integrated Circuits   |h [libro electrónico] /   |c by Wenjian Yu, Xiren Wang. 
260 1 |a Berlin, Heidelberg :  |b Springer Berlin Heidelberg :  |b Imprint: Springer,  |c 2014. 
300 |a xv, 246 p. :   |b il. 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
347 |a text file  |b PDF  |2 rda 
505 0 |a Introduction -- Basic Field-Solver Techniques for RC Extraction -- Fast Boundary Element Methods for Capacitance Extraction (I) -- Fast Boundary Element Methods for Capacitance Extraction (II) -- Resistance Extraction of Complex 3-D Interconnects -- Substrate Resistance Extraction with Boundary Element Method -- Extracting Frequency-Dependent Substrate Parasitics -- Process Variation Aware Capacitance Extraction -- Statistical Capacitance Extraction Based on Continuous-Surface Geometric Model -- Fast Floating Random Walk Method for Capacitance Extraction -- FRW Based Solver for Chip-Scale Large Structures. 
520 |a Resistance and capacitance (RC) extraction is an essential step in modeling the interconnection wires and substrate coupling effect in nanometer-technology integrated circuits (IC). The field-solver techniques for RC extraction guarantee the accuracy of modeling, and are becoming increasingly important in meeting the demand for accurate modeling and simulation of VLSI designs. Advanced Field-Solver Techniques for RC Extraction of Integrated Circuits presents a systematic introduction to, and treatment of, the key field-solver methods for RC extraction of VLSI interconnects and substrate coupling in mixed-signal ICs. Various field-solver techniques are explained in detail, with real-world examples to illustrate the advantages and disadvantages of each algorithm. This book will benefit graduate students and researchers in the field of electrical and computer engineering, as well as engineers working in the IC design and design automation industries. Dr. Wenjian Yu is an Associate Professor at the Department of Computer Science and Technology at Tsinghua University in China; Dr. Xiren Wang is a R&D Engineer at Cadence Design Systems in the USA. 
650 0 |a Computer simulation.  |9 259720 
650 0 |a Computer-aided engineering.  |9 259704 
650 0 |a Computer mathematics.  |9 259612 
650 0 |a Electronic circuits.  |9 259798 
650 1 4 |a Engineering.  |9 259622 
650 2 4 |a Circuits and Systems.  |9 259651 
650 2 4 |a Numerical Analysis.  |9 260924 
650 2 4 |a Simulation and Modeling.  |9 259727 
700 1 |a Wang, Xiren.  |9 261870 
776 0 8 |i Printed edition:  |z 9783642542978 
856 4 0 |u http://dx.doi.org/10.1007/978-3-642-54298-5 
912 |a ZDB-2-ENG 
929 |a COM 
942 |c EBK  |6 _ 
950 |a Engineering (Springer-11647) 
999 |a SKV  |c 28165  |d 28165