Trace-Based Post-Silicon Validation for VLSI Circuits

This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits.  The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and...

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Detalles Bibliográficos
Autor principal: Liu, Xiao
Otros Autores: Xu, Qiang
Formato: Libro electrónico
Lenguaje:Inglés
Publicado: Heidelberg : Springer International Publishing : Imprint: Springer, 2014.
Colección:Lecture Notes in Electrical Engineering, 252
Materias:
Engineering.
Microprocessors.
Semiconductors.
Electronic circuits.
Circuits and Systems.
Processor Architectures.
Acceso en línea:http://dx.doi.org/10.1007/978-3-319-00533-1
Aporte de:Registro referencial: Solicitar el recurso aquí
Bibliotecas (ING-UNLP) de Universidad Nacional de La Plata
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100 1 |a Liu, Xiao.  |9 260331 
245 1 0 |a Trace-Based Post-Silicon Validation for VLSI Circuits   |h [libro electrónico] /   |c by Xiao Liu, Qiang Xu. 
260 1 |a Heidelberg :  |b Springer International Publishing :  |b Imprint: Springer,  |c 2014. 
300 |a xv, 108 p. :   |b il. 
336 |a text  |b txt  |2 rdacontent 
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490 1 |a Lecture Notes in Electrical Engineering,  |x 1876-1100 ;  |v 252 
505 0 |a Introduction -- State of the Art on Post-Silicon Validation -- Signal Selection for Visibility Enhancement -- Multiplexed Tracing for Design Error -- Tracing for Electrical Error -- Reusing Test Access Mechanisms -- Interconnection Fabric for Flexible Tracing -- Interconnection Fabric for Systematic Tracing -- Conclusion. 
520 |a This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits.  The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective.  A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices. ·         Provides a comprehensive summary of state-of-the-art on post-silicon validation; ·         Offers automated solutions that are systematic and cost-effective for post-silicon validation, from trace signal selection to trace data transfer; ·         Illustrate key concepts and algorithms with real examples.        . 
650 0 |a Engineering.  |9 259622 
650 0 |a Microprocessors.  |9 259640 
650 0 |a Semiconductors.  |9 259967 
650 0 |a Electronic circuits.  |9 259798 
650 2 4 |a Circuits and Systems.  |9 259651 
650 2 4 |a Processor Architectures.  |9 259645 
700 1 |a Xu, Qiang.  |9 260332 
776 0 8 |i Printed edition:  |z 9783319005324 
856 4 0 |u http://dx.doi.org/10.1007/978-3-319-00533-1 
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