Optical methods of measurement : wholefield techniques /

Optical Methods of Measurement: Wholefield Techniques, Second Edition provides a comprehensive collection of wholefield optical measurement techniques for engineering applications. Along with the reorganization of contents, this edition includes a new chapter on optical interference, new material on...

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Detalles Bibliográficos
Autor principal: Sirohi, R. S.
Formato: Libro
Lenguaje:Inglés
Publicado: Boca Raton : CRC Press, c2009.
Edición:2nd ed.
Colección:Optical science and engineering (Boca Raton, Fla.) ; 146.
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Acceso en línea:Tapa
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Aporte de:Registro referencial: Solicitar el recurso aquí
LEADER 02718cam#a2200373#a#4500
001 BCCAB019013
008 090507s2009####flud###f#b####001#0#eng##
005 20191230120058.0
003 AR-BCCAB
245 1 0 |a Optical methods of measurement :  |b wholefield techniques /  |c Rajpal S. Sirohi. 
250 # # |a 2nd ed. 
260 # # |a Boca Raton :  |b CRC Press,  |c c2009. 
300 # # |a xxviii, 290 p. :  |b il. ;  |c 25 cm. 
490 1 # |a Optical science and engineering ;  |v 146 
504 # # |a Incluye referencias bibliográficas e índice. 
520 # # |a Optical Methods of Measurement: Wholefield Techniques, Second Edition provides a comprehensive collection of wholefield optical measurement techniques for engineering applications. Along with the reorganization of contents, this edition includes a new chapter on optical interference, new material on nondiffracting and singular beams and their applications, and updated bibliography and additional reading sections. The book explores the propagation of laser beams, metrological applications of phase-singular beams, various detectors such as CCD and CMOS devices, and recording materials. It also covers interference, diffraction, and digital fringe pattern measurement techniques, with special emphasis on phase measurement interferometry and algorithms. The remainder of the book focuses on theory, experimental arrangements, and applications of wholefield techniques. The author discusses digital hologram interferometry, digital speckle photography, digital speckle pattern interferometry, Talbot interferometry, and holophotoelasticity. This updated book compiles the major wholefield methods of measurement in one volume. It provides a solid understanding of the techniques by describing the physics behind them. In addition, the examples given illustrate how the techniques solve measurement problems. 
020 # # |a 9781574446975 (hardcover : alk. paper) 
020 # # |a 1574446975 (hardcover : alk. paper) 
100 1 # |a Sirohi, R. S. 
830 # 0 |a Optical science and engineering (Boca Raton, Fla.) ;  |v 146. 
080 # # |a 535.41 
653 # # |a Optical measurements 
653 # # |a Digital interferometry 
653 # # |a Mediciones ópticas 
653 # # |a Interferometría digital 
690 # # |a Ingeniería en Telecomunicaciones 
010 # # |a ##2009019252 
016 7 # |a 015262349  |2 Uk 
040 # # |a DLC  |c DLC  |d BTCTA  |d BAKER  |d YDXCP  |d UKM  |d C#P  |d BWX  |d CDX  |d OKU  |d DLC  |b spa  |d arbccab 
856 4 1 |u https://images-na.ssl-images-amazon.com/images/I/51k9KIj4sJL.%5FSX351%5FBO1,204,203,200%5F.jpg  |3 Tapa 
856 4 1 |u http://campi.cab.cnea.gov.ar/tocs/24051.pdf  |3 Indice 
082 0 0 |a 681/.25  |2 22 
942 # # |c BK 
952 # # |2 udc  |a ARBCCAB  |b ARBCCAB  |d 20191212  |i 24051  |o 535.41 Si79 Ed.2  |p 24051  |t 1  |y BK