Symposium on the Ellipsometer and its Use in the Measurement of Surfaces and Thin Films Washington, D.C., Passaglia, E., Stromberg, R. R., & Kruger, J. (1964). Ellipsometry in the measurement of surfaces and thin films: Symposium proceedings. U.S. National Bureau of Standards.
Cita Chicago Style (17a ed.)Symposium on the Ellipsometer and its Use in the Measurement of Surfaces and Thin Films Washington, D.C., Elio Passaglia, Robert R. Stromberg, y Jerome Kruger. Ellipsometry in the Measurement of Surfaces and Thin Films: Symposium Proceedings. Washington: U.S. National Bureau of Standards, 1964.
Cita MLA (8a ed.)Symposium on the Ellipsometer and its Use in the Measurement of Surfaces and Thin Films Washington, D.C., et al. Ellipsometry in the Measurement of Surfaces and Thin Films: Symposium Proceedings. U.S. National Bureau of Standards, 1964.