Ellipsometry in the measurement of surfaces and thin films ; symposium proceedings.

Guardado en:
Detalles Bibliográficos
Autor Corporativo: Symposium on the Ellipsometer and its Use in the Measurement of Surfaces and Thin Films Washington, D.C.
Otros Autores: Passaglia, Elio (ed.), Stromberg, Robert R. (ed.), Kruger, Jerome (ed.)
Formato: Documento Gubernamental Acta de conferencia Libro
Lenguaje:Inglés
Publicado: Washington : U.S. National Bureau of Standards, 1964.
Colección:United States. National Bureau of Standards. Miscellaneous publication ; 256.
Materias:
Aporte de:Registro referencial: Solicitar el recurso aquí
LEADER 01373cam#a22003491a#4500
001 BCCAB007044
008 740729s1964####dcua#####b####100#0#engs#
005 20060529085433.0
003 AR-BCCAB
245 1 0 |a Ellipsometry in the measurement of surfaces and thin films ;  |b symposium proceedings. 
260 # # |a Washington :  |b U.S. National Bureau of Standards,  |c 1964. 
300 # # |a vi, 359 p. :  |b il. ;  |c 24 cm. 
504 # # |a Incluye referencias bibliográficas. 
111 2 # |a Symposium on the Ellipsometer and its Use in the Measurement of Surfaces and Thin Films  |d (1963 :  |c Washington, D.C.) 
700 1 # |a Passaglia, Elio,  |e ed. 
700 1 # |a Stromberg, Robert R.,  |e ed. 
700 1 # |a Kruger, Jerome,  |e ed. 
810 1 # |a United States.  |b National Bureau of Standards.  |t Miscellaneous publication ;  |v 256. 
086 # # |a C 13.10:256 
650 # 0 |a Polarization (Light) 
650 # 0 |a Surfaces (Technology) 
650 # 0 |a Thin films. 
010 # # |a ###64060043# 
050 0 0 |a QC100  |b .U57 no. 256 
051 # # |a QC443  |b .S9 1963 Copy 2  |c Copy 3. 
049 # # |a AR5A 
490 1 # |a United States. National Bureau of Standards. Miscellaneous publication ;  |v 256. 
040 # # |a DLC  |c WPG  |d DLC  |d OCLCQ  |b spa  |d arbccab 
500 # # |a Edited by E. Passaglia, R.R. Strombery, and J. Kruger. 
082 0 # |a 535.5 
942 # # |c BK 
952 # # |2 udc  |a ARBCCAB  |b ARBCCAB  |i 8566  |o 539.23:061.3 S68 1963  |p 8566  |t 1  |y BK