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1por Rego, E. C. P., Simon, M. E., Li, Xiuqin, Li, Xiaomin, Daireaux, A., Choteau, T., Westwood, S., Josephs, R. D., Wielgosz, R. I., Cunha, V. S., Brazilian Congress on Metrology, 9
Publicado 2018conferenceObject -
2por Rego, E. C. P., Simon, M. E., Li, Xiuqin, Li, Xiaomin, Daireaux, A., Choteau, T., Westwood, S., Josephs, R. D., Wielgosz, R. I., Cunha, V. S., Brazilian Congress on Metrology, 9
Publicado 2018conferenceObject -
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