Snapshot polarimeter based on the conical refraction phenomenon

por Peinado, A., Lizana, A., Turpin, A., Estévez, I., Iemmi, C., Kalkanjiev, T.K., Mompart, J., Campos, J., Silver R.M., Bodermann B., Frenner K., The Society of Photo-Optical Instrumentation Engineers (SPIE)