Characteristics of graphene for quantized hall effect measurements

por Elmquist, Randolph E., Shen, Tian, Real, Mariano, Calizo, Irene G., Bush, Brian G., He, Guowei, Yang, Yanfei, Klimov, Nikolai, Newell, David B., Hight-Walker, Angela R., Feenstra, Randall M., National Institute of Standards and Technology. NIST. Gaithersburg, US, INTI-Física y Metrología. Buenos Aires, AR, Carnegie-Mellon University. Pittsburgh, US, Georgetown University. Washington, US, Conference on precision electromagnetic measurements
Publicado 2012

Key Comparison CCQM-K73 amount content of H+ in hydrochloric acid (0.1 mol·kg-1)

por Pratt, Kenneth W., Ortiz-Aparicio, Jose Luis, Matehuala-Sanchez, Francisco Javier, Pawlina, Monika, Kozłowski, Władysław, Borges, Paulo P., Silva, Wiler B. da, Borinsky, Mónica B., Hernandez, Ana, Puelles, Mabel, Hatamleh, Nadia, Acosta, Osvaldo, Nunes, João, Guiomar Lito, M. J., Camões, M. Filomena, Filipe, Eduarda, Hwang, Euijin, Lim, Youngran, Bing, Wu, Qian, Wang, Chao, Wei, Hioki, Akiharu, Asakai, Toshiaki, Máriássy, Michal, Hanková, Zuzana, Nagibin, Sergey, Manska, Olexandra, Gavrilkin, Vladimir, Centro Nacional de Metrología. CENAM, MX, Dansk Fundamental Metrology. DFM, DK, Główny Urząd Miar. GUM, PL, Instituto Nacional de Metrologia, Normalização e Qualidade Industrial. INMETRO, BR, INTI-Química. Buenos Aires, AR, Instituto Português da Qualidade - Scientific and Applied Metrology Unit. IPQ/UMCA-LCM, PT, Korea Research Institute of Standards and Science. KRISS, KR, National Institute of Metrology of P. R. China. NIM, CN, National Institute of Standards and Technology. NIST, US, National Metrology Institute of Japan. NMIJ, JP, Slovenský Metrologický Ústav. SMU, SK, Ukrainian State Research and Production Center of Standardization Metrology, Certification, and Consumers’ Rights Protection. UMTS, UA, All-Russian Scientific Institute for Physical-Technical and Radiological Measurements. VNIIFTRI, RU
Publicado 2012

The SIM time network

por Lombardi, Michael A., Novick, Andrew N., López R., J. Mauricio, Jiménez, Francisco, López, Eduardo, Boulanger, Jean-Simon, Pelletier, Raymond, Carvalho, Ricardo J. de, Solís, Raúl, Sánchez, Harold, Quevedo, Carlos Andrés, Pascoe, Gregory, Pérez, Daniel, Bances, Eduardo, Trigo, Leonardo, Masi, Víctor, Postigo, Henry, Questelles, Anthony, Gittens, Anselm, National Institute of Standards and Technology. NIST. Boulder, CO, US, Centro Nacional de Metrología. CENAM. Querétaro, MX, National Research Council. NRC. Ottawa, CA, National Observatory. ONRJ. Río de Janeiro, BR, Centro Nacional de Metrología de Panamá. CENAMEP. Panama City, PA, Instituto Costarricense de Electricidad. ICE. San José, CR, Superintendencia de Industria y Comercio. SIC. Bogotá, CO, Bureau of Standards Jamaica. BSJ. Kingston, JM, Instituto Nacional de Tecnología Industrial. INTI-Física y Metrología. Buenos Aires, AR, Laboratorio Nacional de Metrología. LNM. Guatemala City, GT, Administracion Nacional de Usinas y Trasmisiones Eléctricas . UTE. Montevideo, UY, Instituto Nacional de Tecnología Normalización y Metrología. INTN. Asunción, PY, Servicio Nacional de Metrología. SNM, INDECOPI. Lima, PE, Trinidad and Tobago Bureau of Standards. TTBS, TT, Saint Lucia Bureau of Standard. SLBS. Castries, LC
Publicado 2011