Materias dentro de su búsqueda.
Materias dentro de su búsqueda.
Atomic force microscopy
2
Bias conditions
Carbon nanotubes
2
Cavity resonators
2
Chemical vapor deposition
2
Floating potentials
2
Ground potential
2
Morphology
2
Nanofibers
2
Nanostructured materials
2
Ni coating
2
Ni films
2
Nickel coatings
2
Pulsed vacuum arc
SEM and TEM
2
Semiconducting silicon compounds
2
Silicon wafers
2
Substrate bias
2
Thin films
2
Vacuum
2
Vacuum applications
2
Vacuum arcs
2
Vacuum deposited coatings
2
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1
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2por Escobar, M., Giuliani, L., Candal, R.J., Lamas, D.G., Caso, A., Rubiolo, G., Grondona, D., Goyanes, S., Márquez, A.JOUR