Materias dentro de su búsqueda.
Materias dentro de su búsqueda.
Atomic force microscopy
Thin films
2
Vacuum applications
2
Annealing temperatures
1
Bias conditions
1
Carbon nanotubes
1
Cathodic Arc Deposition
1
Cathodic arc deposition
1
Cavity resonators
1
Chemical vapor deposition
1
Deposition
1
Floating potentials
1
Ground potential
1
Imaging techniques
1
Morphology
1
Nanofibers
1
Nanostructured materials
1
Ni coating
1
Ni films
1
Nickel coatings
1
Oscillatory behaviors
1
Oxide minerals
1
Pulsed vacuum arc
1
Qualitative analysis
1
SEM and TEM
1
Scanning electron microscopy
1
Semiconducting silicon compounds
1
Silicon wafers
1
Substrate bias
1
Substrates
1
-
1Materias: “...Thin Films...”
JOUR -
2por Escobar, M., Giuliani, L., Candal, R.J., Lamas, D.G., Caso, A., Rubiolo, G., Grondona, D., Goyanes, S., Márquez, A.Materias: “...Thin films...”
JOUR