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Atomic force microscopy
Bias conditions
Carbon nanotubes
1
Cavity resonators
1
Chemical vapor deposition
1
Floating potentials
1
Ground potential
1
Morphology
1
Nanofibers
1
Nanostructured materials
1
Ni coating
1
Ni films
1
Nickel coatings
1
Pulsed vacuum arc
1
SEM and TEM
1
Semiconducting silicon compounds
1
Silicon wafers
1
Substrate bias
1
Thin films
1
Vacuum
1
Vacuum applications
1
Vacuum arcs
1
Vacuum deposited coatings
1
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1por Escobar, M., Giuliani, L., Candal, R.J., Lamas, D.G., Caso, A., Rubiolo, G., Grondona, D., Goyanes, S., Márquez, A.Materias: “...Atomic force microscopy...”
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