Optical testing of perturbations on successive layers: Digital discrimination and multilocalized fringes

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A two-beam amplitude division interferometer with negligible equivalent aberrations, verifying the equivalent sine condition and illuminated by an incoherent extended periodic source yields various non-classical localization planes. The source period can be chosen so that a non-classical localizatio...

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Detalles Bibliográficos
Autores principales: Comastri, S.A., Echarri, R.M., Simon, J.M.
Formato: JOUR
Materias:
Digital discrimination
Interferometry
Non-classical localization planes
Aberrations
Birefringence
Cameras
Charge coupled devices
Interferometers
Optical films
Optical systems
Perturbation techniques
Prisms
Multilocalized fringes
Two-beam amplitude division interferometer
Videofilm
Optical testing
Acceso en línea:http://hdl.handle.net/20.500.12110/paper_14644258_v5_n3_p283_Comastri
Aporte de:
Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA) de Universidad de Buenos Aires

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