Optical testing of perturbations on successive layers: Digital discrimination and multilocalized fringes
A two-beam amplitude division interferometer with negligible equivalent aberrations, verifying the equivalent sine condition and illuminated by an incoherent extended periodic source yields various non-classical localization planes. The source period can be chosen so that a non-classical localizatio...
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| Autores principales: | , , |
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| Formato: | JOUR |
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| Acceso en línea: | http://hdl.handle.net/20.500.12110/paper_14644258_v5_n3_p283_Comastri |
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| Sumario: | A two-beam amplitude division interferometer with negligible equivalent aberrations, verifying the equivalent sine condition and illuminated by an incoherent extended periodic source yields various non-classical localization planes. The source period can be chosen so that a non-classical localization plane coincides with the plane where the images of one of the layers of a thick transparent sample are located thus detecting the perturbations present on this layer and blurring defects corresponding to other layers. In the present paper the process of focalizing different layers and making them coincide with nonclassical localization planes is digitally synthesized starting from a videofilm taken on one observation plane as a point source moves. Images acquired using a Wollaston prism as an interferometer are shown. |
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