On the use of sweeping Langmuir probes in cutting-arc plasmas - Part II: Interpretation of the results
A semiempirical Langmuir probe model is introduced that is particularly adapted to high-energy-density cutting arcs, for which, as we have shown in Part I, the ion current collected by negatively biased probes shows no plateau in the ion branch of the current-voltage (I-V) probe characteristic, and...
Guardado en:
Autores principales: | Prevosto, L., Kelly, H., Minotti, F. |
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Formato: | JOUR |
Materias: | |
Acceso en línea: | http://hdl.handle.net/20.500.12110/paper_00933813_v36PART2_n1_p271_Prevosto |
Aporte de: |
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