The plate diagram and its application to off axis systems and spectrographs
A generalization of the plate diagram is given which permits the calculation of the aberrations of off-axis systems, taking into account anamorphosis due to the grating. It is preferable to work with the deformations of the wavefront rather than Seidel coefficients because in this way anamorphosis c...
Guardado en:
Autor principal: | Simon, J.M. |
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Formato: | JOUR |
Acceso en línea: | http://hdl.handle.net/20.500.12110/paper_00303909_v20_n5_p345_Simon |
Aporte de: |
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