Harmonic demodulation and minimum enhancement factors in field-enhanced near-field optical microscopy

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Field-enhanced scanning optical microscopy relies on the design and fabrication of plasmonic probes which had to provide optical and chemical contrast at the nanoscale. In order to do so, the scattering containing the near-field information recorded in a field-enhanced scanning optical microscopy ex...

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Detalles Bibliográficos
Autores principales: Scarpettini, A.F., Bragas, A.V.
Formato: JOUR
Materias:
Enhancement factor
Harmonic demodulation
Scanning near-field optical microscopy
Article
field enhanced near field optical microscopy
frequency modulation
laser
mathematical analysis
mathematical computing
mathematical model
prediction
Raman spectrometry
scanning electron microscopy
signal detection
signal processing
Acceso en línea:http://hdl.handle.net/20.500.12110/paper_00222720_v257_n1_p54_Scarpettini
Aporte de:
Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA) de Universidad de Buenos Aires

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