Extension of the measurement range of MOS dosimeters using radiation induced charge neutralization

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This work proposes a new measurement technique to extend the dose range of MOS dosimeters. The technique consists on alternating stages of positive oxide charge buildup with stages of radiation induced charge neutralization, maintaining a uniform sensitivity along the whole measurement. The techniqu...

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Autores principales: Faigón, A., Lipovetzky, J., Redin, E., Krusczenski, G.
Formato: JOUR
Materias:
Dosimetry
Gamma rays
MOS devices
Radiation effects
Dose measurements
Dose range
Induced charges
Initial saturation
Interface trapping
Measurement range
Measurement techniques
Positive oxide charge
Wear effects
Dosimeters
Acceso en línea:http://hdl.handle.net/20.500.12110/paper_00189499_v55_n4_p2141_Faigon
Aporte de:
Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA) de Universidad de Buenos Aires
id todo:paper_00189499_v55_n4_p2141_Faigon
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spelling todo:paper_00189499_v55_n4_p2141_Faigon2023-10-03T14:16:23Z Extension of the measurement range of MOS dosimeters using radiation induced charge neutralization Faigón, A. Lipovetzky, J. Redin, E. Krusczenski, G. Dosimetry Gamma rays MOS devices Radiation effects Dosimetry Dose measurements Dose range Gamma rays Induced charges Initial saturation Interface trapping Measurement range Measurement techniques MOS devices Positive oxide charge Radiation effects Wear effects Dosimeters This work proposes a new measurement technique to extend the dose range of MOS dosimeters. The technique consists on alternating stages of positive oxide charge buildup with stages of radiation induced charge neutralization, maintaining a uniform sensitivity along the whole measurement. The technique was applied with 70 nm MOS dosimeters, extending the dose measurement range from less than a kilogray to more than 675 kGy without showing wear effects. An initial saturation of interface traps creation ensures repeatability in the responses. © 2008 IEEE. JOUR info:eu-repo/semantics/openAccess http://creativecommons.org/licenses/by/2.5/ar http://hdl.handle.net/20.500.12110/paper_00189499_v55_n4_p2141_Faigon
institution Universidad de Buenos Aires
institution_str I-28
repository_str R-134
collection Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA)
topic Dosimetry
Gamma rays
MOS devices
Radiation effects
Dosimetry
Dose measurements
Dose range
Gamma rays
Induced charges
Initial saturation
Interface trapping
Measurement range
Measurement techniques
MOS devices
Positive oxide charge
Radiation effects
Wear effects
Dosimeters
spellingShingle Dosimetry
Gamma rays
MOS devices
Radiation effects
Dosimetry
Dose measurements
Dose range
Gamma rays
Induced charges
Initial saturation
Interface trapping
Measurement range
Measurement techniques
MOS devices
Positive oxide charge
Radiation effects
Wear effects
Dosimeters
Faigón, A.
Lipovetzky, J.
Redin, E.
Krusczenski, G.
Extension of the measurement range of MOS dosimeters using radiation induced charge neutralization
topic_facet Dosimetry
Gamma rays
MOS devices
Radiation effects
Dosimetry
Dose measurements
Dose range
Gamma rays
Induced charges
Initial saturation
Interface trapping
Measurement range
Measurement techniques
MOS devices
Positive oxide charge
Radiation effects
Wear effects
Dosimeters
description This work proposes a new measurement technique to extend the dose range of MOS dosimeters. The technique consists on alternating stages of positive oxide charge buildup with stages of radiation induced charge neutralization, maintaining a uniform sensitivity along the whole measurement. The technique was applied with 70 nm MOS dosimeters, extending the dose measurement range from less than a kilogray to more than 675 kGy without showing wear effects. An initial saturation of interface traps creation ensures repeatability in the responses. © 2008 IEEE.
format JOUR
author Faigón, A.
Lipovetzky, J.
Redin, E.
Krusczenski, G.
author_facet Faigón, A.
Lipovetzky, J.
Redin, E.
Krusczenski, G.
author_sort Faigón, A.
title Extension of the measurement range of MOS dosimeters using radiation induced charge neutralization
title_short Extension of the measurement range of MOS dosimeters using radiation induced charge neutralization
title_full Extension of the measurement range of MOS dosimeters using radiation induced charge neutralization
title_fullStr Extension of the measurement range of MOS dosimeters using radiation induced charge neutralization
title_full_unstemmed Extension of the measurement range of MOS dosimeters using radiation induced charge neutralization
title_sort extension of the measurement range of mos dosimeters using radiation induced charge neutralization
url http://hdl.handle.net/20.500.12110/paper_00189499_v55_n4_p2141_Faigon
work_keys_str_mv AT faigona extensionofthemeasurementrangeofmosdosimetersusingradiationinducedchargeneutralization
AT lipovetzkyj extensionofthemeasurementrangeofmosdosimetersusingradiationinducedchargeneutralization
AT redine extensionofthemeasurementrangeofmosdosimetersusingradiationinducedchargeneutralization
AT krusczenskig extensionofthemeasurementrangeofmosdosimetersusingradiationinducedchargeneutralization
_version_ 1807323930674855936

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