Optical testing of perturbations on successive layers: Digital discrimination and multilocalized fringes

A two-beam amplitude division interferometer with negligible equivalent aberrations, verifying the equivalent sine condition and illuminated by an incoherent extended periodic source yields various non-classical localization planes. The source period can be chosen so that a non-classical localizatio...

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Detalles Bibliográficos
Publicado:	2003
Materias:	Digital discrimination Interferometry Non-classical localization planes Aberrations Birefringence Cameras Charge coupled devices Interferometers Optical films Optical systems Perturbation techniques Prisms Multilocalized fringes Two-beam amplitude division interferometer Videofilm Optical testing
Acceso en línea:	https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_14644258_v5_n3_p283_Comastri http://hdl.handle.net/20.500.12110/paper_14644258_v5_n3_p283_Comastri
Aporte de:	Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA) de Universidad de Buenos Aires

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