Cita APA (7a ed.)

Belcher, A., Williams, J., Ireland, J., Iuzzolino, R., Bierzychudek, M. E., Dekker, R., . . . World Congress of the International Measurement Confederation, 1. (2018). Towards a metrology class ADC based on Josephson junction devices. IOP.

Cita Chicago Style (17a ed.)

Belcher, Allan, et al. Towards a Metrology Class ADC Based on Josephson Junction Devices. IOP, 2018.

Cita MLA (8a ed.)

Belcher, Allan, et al. Towards a Metrology Class ADC Based on Josephson Junction Devices. IOP, 2018.