Parodi, M. B., Rodríguez, L., Pazos, L., González Ruiz, J., Paz Ramos, A., Ybarra, G., . . . International Congress on Metallurgy & Materials SAM/CONAMET 2011, 1. (2012). Application of the Berreman effect to the characterization of TiO2 thin layers formed onto titanium substrates. Elsevier.
Cita Chicago Style (17a ed.)Parodi, M. B., et al. Application of the Berreman Effect to the Characterization of TiO2 Thin Layers Formed onto Titanium Substrates. Elsevier, 2012.
Cita MLA (8a ed.)Parodi, M. B., et al. Application of the Berreman Effect to the Characterization of TiO2 Thin Layers Formed onto Titanium Substrates. Elsevier, 2012.
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