Hidden grids, moiré patterns and optoelectronically measurement of distances

Hidden grids from the photocopy process are used to produce moiré patterns. The method of production of moiré patterns is extended to hidden grids generated in the optoelectronical CCD observations. An application of this moiré is proposed to measure distances.

Guardado en:
Detalles Bibliográficos
Autores principales: Garavaglia, Mario José, Laquidara, Anibal Pablo
Formato: Objeto de conferencia
Lenguaje:Inglés
Publicado: 1999
Materias:
Física
photocopier hidden grids
CCD hidden grids
moire effect
distance measurement
Acceso en línea:http://sedici.unlp.edu.ar/handle/10915/80396
Aporte de:
SEDICI (UNLP) de Universidad Nacional de La Plata
Descripción
Sumario:Hidden grids from the photocopy process are used to produce moiré patterns. The method of production of moiré patterns is extended to hidden grids generated in the optoelectronical CCD observations. An application of this moiré is proposed to measure distances.

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