Analog Configurability-Test Scheme for an Embedded Op-Amp Module in TI MSP430 Microcontrollers

This paper proposes the application of the analog configurability test (ACT) approach for an embedded analog configurable circuit, composed by operational amplifiers and interconnection resources that are embedded in the MSP430xG461x microcontrollers family, with the aim of verifying its mode progra...

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Detalles Bibliográficos
Autores principales: Laprovitta, Agustín, Peretti, Gabriela, Romero, Eduardo
Formato: Objeto de conferencia
Lenguaje:Inglés
Publicado: 2013
Materias:
Ciencias Informáticas
built-in self-test
mixed signal testing
embedded analog test
microcontroller test
Acceso en línea:http://sedici.unlp.edu.ar/handle/10915/76856
http://42jaiio.sadio.org.ar/proceedings/simposios/Trabajos/AST/12.pdf
Aporte de:
SEDICI (UNLP) de Universidad Nacional de La Plata

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