Modulated speckle simulations based on the random-walk model

The random walk model is employed to simulate modulated speckle patterns. We demonstrate that the geo metrical image approximation fails to describe the modulated speckle pattern. A new approach to analyzing this phenomenon is proposed. The validity of the approximations employed is verified by co...

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Autores principales: Lencina, Alberto, Vaveliuk, Pablo, Tebaldi, Myrian Cristina, Bolognini, Néstor Alberto
Formato: Articulo
Lenguaje:Inglés
Publicado: 2003
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Acceso en línea:http://sedici.unlp.edu.ar/handle/10915/44355
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