Evidence of defect-induced ferromagnetism in ZnFe₂O₄ thin films
X-ray absorption near-edge and grazing incidence x-ray fluorescence spectroscopy are employed to investigate the electronic structure of ZnFe₂O₄ thin films. The spectroscopy techniques are used to determine the nonequilibrium cation site occupancy as a function of depth and oxygen pressure during de...
Autores principales: | Rodríguez Torres, Claudia Elena, Golmar, F., Ziese, M., Esquinazi, P., Heluani, S. P. |
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Formato: | Articulo Preprint |
Lenguaje: | Inglés |
Publicado: |
2011
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Materias: | |
Acceso en línea: | http://sedici.unlp.edu.ar/handle/10915/146212 |
Aporte de: |
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