Evidence of defect-induced ferromagnetism in ZnFe₂O₄ thin films

X-ray absorption near-edge and grazing incidence x-ray fluorescence spectroscopy are employed to investigate the electronic structure of ZnFe₂O₄ thin films. The spectroscopy techniques are used to determine the nonequilibrium cation site occupancy as a function of depth and oxygen pressure during de...

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Detalles Bibliográficos
Autores principales: Rodríguez Torres, Claudia Elena, Golmar, F., Ziese, M., Esquinazi, P., Heluani, S. P.
Formato: Articulo Preprint
Lenguaje:Inglés
Publicado: 2011
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Acceso en línea:http://sedici.unlp.edu.ar/handle/10915/146212
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Sumario:X-ray absorption near-edge and grazing incidence x-ray fluorescence spectroscopy are employed to investigate the electronic structure of ZnFe₂O₄ thin films. The spectroscopy techniques are used to determine the nonequilibrium cation site occupancy as a function of depth and oxygen pressure during deposition and its effects on the magnetic properties. It is found that low deposition pressures below 10 ⁻³ mbar cause iron superoccupation of tetrahedral sites without Zn²⁺ inversion, resulting in an ordered magnetic phase with high room-temperature magnetic moment.