Cita APA (7a ed.)

Simón, M. R., Ayala, F. M., Cordo, C. A., Röder, M. S., & Börner, A. (2004). Molecular mapping of quantitative trait loci determining resistance to septoria tritici blotch caused by <i>Mycosphaerella graminicola</i> in wheat.

Cita Chicago Style (17a ed.)

Simón, María Rosa, Francisco M. Ayala, Cristina Alicia Cordo, Marion S. Röder, y Andreas Börner. Molecular Mapping of Quantitative Trait Loci Determining Resistance to Septoria Tritici Blotch Caused by <i>Mycosphaerella Graminicola</i> in Wheat. 2004.

Cita MLA (8a ed.)

Simón, María Rosa, et al. Molecular Mapping of Quantitative Trait Loci Determining Resistance to Septoria Tritici Blotch Caused by <i>Mycosphaerella Graminicola</i> in Wheat. 2004.