A built-in self-test approach for the embedded resistor array in TI MSP430 microcontrollers

In this paper, we propose a built-in self-test (BIST) for the resistor array in an embedded analog configurable circuit (EACC) that is present in the Texas Instruments® MSP430 microcontrollers family. The EACC is formed also by an Operational Amplifier (OA) and interconnection resources. We focus in...

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Detalles Bibliográficos
Autores principales: Laprovitta, Agustín, Peretti, Gabriela, Romero, Eduardo
Formato: Objeto de conferencia
Lenguaje:Inglés
Publicado: 2011
Materias:
Ciencias Informáticas
built-in self-test
mixed signal testing
embedded analog test
Acceso en línea:http://sedici.unlp.edu.ar/handle/10915/125314
Aporte de:
SEDICI (UNLP) de Universidad Nacional de La Plata

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