Low-cost dc bist for analog circuits: a case study

This paper presents a DC analog testing technique based on a simple voltage comparison of the highest sensitivity node, which is found by simulation. The technique is a structural, fault driven testing approach and can be applied to any analog circuit with very few extra added circuitry. A proof of...

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Detalles Bibliográficos
Autores principales: Petrashin, Pablo, Dualibe, Carlos, Toledo, Luis, Lancioni, Walter
Formato: conferenceObject
Lenguaje:Inglés
Publicado: Facultad de Ciencias Exactas, Físicas y Naturales 2021
Materias:
DC_TEST
Analog
Testing
Electrónica
Acceso en línea:http://hdl.handle.net/11086/20347
Aporte de:
Repositorio Digital Universitario (UNC) de Universidad Nacional de Córdoba

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