Non-absorbing isotropic-uniaxial interfaces: Refraction in ordinary and extraordinary total reflection

We study characteristics of refraction of plane waves in a non-absorbing isotropic-uniaxial interface in conditions of total and partial reflection when the incident wave has arbitrary direction with regard to the optical axis of the crystal and polarization. We analyse the ordinary and extraordinar...

Descripción completa

Guardado en:
Detalles Bibliográficos
Autor principal: Pérez, Liliana Inés
Otros Autores: Vanney, C.E
Formato: Capítulo de libro
Lenguaje:Inglés
Publicado: 2005
Acceso en línea:Registro en Scopus
DOI
Handle
Registro en la Biblioteca Digital
Aporte de:Registro referencial: Solicitar el recurso aquí
Descripción
Sumario:We study characteristics of refraction of plane waves in a non-absorbing isotropic-uniaxial interface in conditions of total and partial reflection when the incident wave has arbitrary direction with regard to the optical axis of the crystal and polarization. We analyse the ordinary and extraordinary fields and a phase shift that appears in the propagating wave which subsists in ordinary or extraordinary total reflection. We obtain that, unlike what happens in isotropic interfaces, under conditions of ordinary total reflection, the ordinary time-averaged Poynting vector changes its direction with the angle of incidence which does not depend on the existence of extraordinary total reflection. Extraordinary total reflection gives place to an analogous behaviour of the extraordinary time-averaged Poynting vector. In addition, we define and calculate in an explicit way complex coefficients of transmission for geometries with and without symmetry in partial and total reflection.
Bibliografía:Sommerfeld, A., (1952) Optics in Lectures on Theoretical Physics, 4. , Academic Press, New York
Born, M., Wolf, E., (1980) Principles of Optics, , Pergamon Press, New York
Ramachandran, G.N., Ramaseshan, S., (1961) Handbuch der Physik, 25 (1). , edited by H. Flügge Springer-Verlag, Berlin
Berreman, D.W., (1971) J. Opt. Soc. Am., 62, p. 502
Elshazly-Zaghloul, M., Azzam, R.M.A., (1982) J. Opt. Soc. Am., 72, p. 657
Abdulhalim, I., (1987) Opt. Commun., 64, p. 443
Azzam, R.M.A., Bashara, N.M., (1988) Ellipsometry and Polarized Light, , North-Holland, Amsterdam
Yeh, P., (1988) Optical Waves in Layered Media, , Wiley, New York
Oldano, C., (1989) Phys. Rev. A, 40, p. 6014
Simon, J.M., Simon, M.C., Presa, V.A., (1993) Optik, 94, p. 137
Lekner, J., (1994) Pure Appl. Opt., 3, p. 821
Simon, J.M., Presa, V.A., (1995) Optik, 98, p. 181
Abdulhalim, I., (1999) J. Opt. A Pure Appl. Opt., 1, p. 655
Simon, M.C., (1983) Appl. Opt., 22, p. 354
Simon, M.C., Echarri, R.M., (1986) Appl. Opt., 25, p. 1935
Simon, M.C., Echarri, R.M., (1989) Opt. Lett., 14, p. 257
Simon, M.C., Perez, L.I., (1989) Optik, 82, p. 37
Sonoda, T., (1989) Electron. Commun. Jpn Part I, 72, p. 95
Perez, L.I., (1990) Reflexión y Refracción en Cristales Birrefringentes Monoaxiales Cap. II, , Doctoral thesis, University of Buenos Aires
Simon, M.C., Perez, L.I., (1991) J. Mod. Opt., 38, p. 503
Lekner, J., (1991) J. Phys. Condens. Matter, 3, p. 6121
Simon, M.C., Farías, D., (1994) J. Mod. Opt., 41, p. 413
Perez, L.I., Simon, M.C., (1993) Optik, 95, p. 53
Perez, L.I., (2002) Pure Appl. Opt. A, 4, p. 640
Simon, M.C., Perez, L.I., (2005) J. Mod. Opt., 52, p. 515
Perez, L.I., Simon, M.C., (2004) SPIE Proc., 5622, p. 1370
Lakhtakia, A., (1990) Optik, 84, p. 160
Lekner, J., (1999) J. Opt. Soc. Am. A, 16, p. 2763
Gottschalk, K.V., Simon, M.C., (2001) J. Opt. Soc. Am. A, 18, p. 673
Perez, L.I., (2003) J. Opt. Soc. Am. A, 20, p. 741
Echarri, R.M., Garea, M.T., (1994) Pure and Appl. Opt., 3, p. 931
Alberdi, C., Alfonso, S., Berrogui, M., (2002) J. Mod. Opt., 49, p. 1553
Perez, L.I., (1994) Optik, 97, p. 142
Veselago, V.G., (1968) Sov. Phys. Usp., 10, p. 509
ISSN:09500340
DOI:10.1080/09500340500106782