Stochastic Process Variation in Deep-Submicron CMOS Circuits and Algorithms /
One of the most notable features of nanometer scale CMOS technology is the increasing magnitude of variability of the key device parameters affecting performance of integrated circuits. The growth of variability can be attributed to multiple factors, including the difficulty of manufacturing control...
Guardado en:
Autor principal: | Zjajo, Amir |
---|---|
Formato: | Libro electrónico |
Lenguaje: | Inglés |
Publicado: |
Dordrecht :
Springer Netherlands : Imprint: Springer,
2014.
|
Colección: | Springer Series in Advanced Microelectronics,
48 |
Materias: | |
Acceso en línea: | http://dx.doi.org/10.1007/978-94-007-7781-1 |
Aporte de: | Registro referencial: Solicitar el recurso aquí |
Ejemplares similares
-
Flash Memories Economic Principles of Performance, Cost and Reliability Optimization /
por: Richter, Detlev
Publicado: (2014) -
Semiconductor Technologies in the Era of Electronics
por: Kang, Yong Hoon
Publicado: (2014) -
Poly-SiGe for MEMS-above-CMOS Sensors
por: Gonzalez Ruiz, Pilar
Publicado: (2014) -
Collective Dynamics from Bacteria to Crowds An Excursion Through Modeling, Analysis and Simulation /
Publicado: (2014) -
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
por: Franco, Jacopo
Publicado: (2014)