Cita APA (7a ed.)

Franco, J., Kaczer, B., & Groeseneken, G. (2014). Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications. Springer Netherlands : Imprint: Springer.

Cita Chicago Style (17a ed.)

Franco, Jacopo, Ben Kaczer, y Guido Groeseneken. Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications. Dordrecht: Springer Netherlands : Imprint: Springer, 2014.

Cita MLA (8a ed.)

Franco, Jacopo, et al. Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications. Springer Netherlands : Imprint: Springer, 2014.